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  • 型号: ZEN056V075A48LS
  • 制造商: CORCOM/TYCO ELECTRONICS
  • 库位|库存: xxxx|xxxx
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ZEN056V075A48LS产品简介:

ICGOO电子元器件商城为您提供ZEN056V075A48LS由CORCOM/TYCO ELECTRONICS设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 ZEN056V075A48LS价格参考。CORCOM/TYCO ELECTRONICSZEN056V075A48LS封装/规格:TVS - 混合技术, 。您可以下载ZEN056V075A48LS参考资料、Datasheet数据手册功能说明书,资料中有ZEN056V075A48LS 详细功能的应用电路图电压和使用方法及教程。

产品参数 图文手册 常见问题
参数 数值
产品目录

电路保护

描述

POLYZEN 5.6V PPTC/ZENER SMDTVS 二极管 - 瞬态电压抑制器 5.6V .28W .75A LS SMD PolyZen DEVICES

产品分类

TVS - 其它复合分离式半导体

品牌

TE Connectivity / Raychem

产品手册

点击此处下载产品Datasheet

产品图片

rohs

符合RoHS无铅 / 符合限制有害物质指令(RoHS)规范要求

产品系列

二极管与整流器,TVS二极管,TVS 二极管 - 瞬态电压抑制器,TE Connectivity / Raychem ZEN056V075A48LSPolyZen,Raychem

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该产品可能需要其他文件才能进口到中国。

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产品型号

ZEN056V075A48LS

产品培训模块

http://www.digikey.cn/PTM/IndividualPTM.page?site=cn&lang=zhs&ptm=6719http://www.digikey.cn/PTM/IndividualPTM.page?site=cn&lang=zhs&ptm=24704

产品目录绘图

产品目录页面

点击此处下载产品Datasheet

产品种类

Radial Lead Resettable Fuses

供应商器件封装

SMD

其它名称

RF1056-000
RF1500-000
ZEN056V075A48LSTR

击穿电压

48 V

功率(W)

700mW

包装

带卷 (TR)

商标

TE Connectivity / Raychem

安装风格

SMD/SMT

封装

Reel

封装/外壳

3-SMD,无引线

尺寸

4.15 mm W x 4.15 mm L x 2 mm H

峰值浪涌电流

0.75 A

峰值脉冲功率耗散

0.7 W

工作电压

5 V

工厂包装数量

3000

应用

通用

技术

混合技术

最大工作温度

+ 85 C

最小工作温度

- 40 C

标准包装

3,000

电压-工作

5.6V

电压-箝位

24V

电容

4200 pF

电路数

1

端接类型

SMD/SMT

钳位电压

5.6 V

零件号别名

RF1500-000

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PDF Datasheet 数据手册内容提取

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 1 OF 8 Specification Status: Released GENERAL DESCRIPTION BENEFITS TE PolyZen devices are polymer enhanced,  Stable Zener diode helps shield downstream precision Zener diode micro-assemblies. electronics from overvoltage and reverse bias They offer resettable protection against multi-Watt fault events without the need for  Trip events shut out overvoltage and reverse bias multi-Watt heat sinks. sources  Analog nature of trip events minimizes upstream The Zener diode used for voltage clamping inductive spikes in a PolyZen micro-assembly was selected due to its relatively flat voltage vs current  Minimal power dissipation requirements response. This helps improve output voltage clamping, even  Single component placement when input voltage is high and diode currents are large. An advanced feature of the PolyZen micro-assembly is that the FEATURES Zener diode is thermally coupled to a resistively non-linear,  Overvoltage transient suppression polymer PTC (positive temperature coefficient) layer. This PTC  Stable V vs fault current layer is fully integrated into the device, and is electrically in Z series between V and the diode clamped V .  Time delayed, overvoltage trip IN OUT  Time delayed, reverse bias trip This advanced PTC layer responds to either extended diode heating or overcurrent events by transitioning from a low to high  Multi-Watt power handling capability resistance state, also known as ”tripping”. A tripped PTC will  Integrated device construction limit current and generate voltage drop. It helps to protect both  RoHS Compliant the Zener diode and the follow on electronics and effectively increases the diode’s power handling capability. TARGET APPLICATIONS The polymer enhanced Zener diode helps protect sensitive  DC power port protection in portable electronics portable electronics from damage caused by inductive voltage spikes, voltage transients, incorrect power supplies and reverse  DC power port protection for systems using bias. These devices are particularly suitable for portable barrel jacks for power input electronics and other low-power DC devices.  Internal overvoltage & transient suppression  DC output voltage regulation TYPICAL APPLICATION BLOCK DIAGRAM PPPooowwweeerrr SSSuuupppppplllyyy PPPooolllyyyZZZeeennn PPPrrrooottteeecccttteeeddd EEEllleeeccctttrrrooonnniiicccsss (((EEExxxttteeerrrnnnaaalll ooorrr IIInnnttteeerrrnnnaaalll))) GGGNNNDDD 222 VVVIIINNN 111 PPoollyyZZeenn +++ DDeevviiccee VVV OOOUUUTTT 333 RRReeeggguuulllaaattteeeddd RRR LLLoooaaaddd OOOuuutttpppuuuttt PPPrrrooottteeecccttteeeddd dddooowwwnnnssstttrrreeeaaammm eeellleeeccctttrrrooonnniiicccsss

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 2 OF 8 CONFIGURATION INFORMATION Pin Configuration (Top View) Pad Dimensions 22 GGNNDD 00..99 44 mmmm ((00..003377””)) 22..2211 mmmm 00..3333 mm mm VV 11 ((00..008877””)) ((00..001133””)) IINN 00..9944 mmmm 33 VV ((00..003377””)) OOUUTT 00..5566 mmmm 22..8888 mmmm 00..5566 mmmm ((00..002222””)) ((00..11113355””)) ((00..002222””)) PIN DESCRIPTION Pin Number Pin Name Pin Function 1 V V . Protected input to Zener diode. IN IN 2 GND GND 3 V V . Zener regulated voltage output OUT OUT BLOCK DIAGRAM PPoollyymmeerr PPTTCC VV IINN VV OOUUTT ZZeenneerr DDiiooddee GGNNDD DEFINITION of TERMS II ,, II II IPTC Current flowing through the PTC portion of the PPTTCC HHOOLLDD OOUUTT circuit I RMS fault current flowing through the diode FLT VV I Current flowing out the V pin of the device IINN OUT OUT Trip Event A condition where the PTC transitions to a high VV resistance state, thereby significantly limiting IPTC OOUUTT and related currents. II FFLLTT Trip Time the PTC portion of the device remains in a Endurance high resistance state. GGNNDD

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 3 OF 8 GENERAL SPECIFICATIONS Operating Temperature -40º to +85ºC Storage Temperature -40º to +85ºC ELECTRICAL CHARACTERISTICS1-3, 11 (Typical unless otherwise specified) V(VZ )4 I 5 Leakage Current VInt( VM )a x8 IFLT Max9 TDriipspseiMpdaa xPt i oo nw 1e 0 r Izt4 @H2O0LºDC R Typ6 R1Max7 (A) (A) (Ohms) (Ohms) VINT Test Test Test Max I Max Value Max Current FLT Voltage Voltage Test (V) (A) (W) Min Typ Max Current (A) (V) (V) Voltage (mA) +10 +48 5.45 5.6 5.75 0.1 0.75 5.25 10 0.28 0.45 48V 3A 0.8 48 -40 -16V Note 1: Electrical characteristics determined at 25ºC unless otherwise specified. Note 2: This device is intended for limited fault protection. Repeated trip events or extended trip endurance can degrade the device and may affect performance to specifications. Performance impact will depend on multiple factors including, but not limited to, voltage, trip current, trip duration, trip cycles, and circuit design. For details or ratings specific to your application contact TE Connectivity Circuit Protection directly. Note 3: Specifications developed using 1.0 ounce 0.045” wide copper traces on dedicated FR4 test boards. Performance in your application may vary. Note 4: I is the current at which V is measured (V = V ). Additional V values are available on request. zt z Z OUT Z Note 5: I : Maximum steady state I (current entering or exiting the V pin of the device) that will not generate a trip event at the HOLD PTC IN specified temperature. Specification assumes I (current flowing through the Zener diode) is sufficiently low so as to prevent FLT the diode from acting as a heat source. Testing is conducted with an “open” Zener. Note 6: R Typ: Resistance between V and V pins during normal operation at room temperature. IN OUT Note 7: R : The maximum resistance between V and V pins at room temperature, one hour after 1st trip or after reflow 1Max IN OUT soldering. Note 8: V Max: V Max relates to the voltage across the PPTC portion of the PolyZen device (V -V ). V Max is defined as the INT INT IN OUT INT voltage (V -V ) at which typical qualification devices (98% devices, 95% confidence) survived at least 100 trip cycles and IN OUT 24 hours trip endurance at the specified voltage (V -V ) and current (I ). V Max testing is conducted using a "shorted" IN OUT PTC INT load (V = 0 V). V Max is a survivability rating, not a performance rating. OUT INT Note 9: I Max: I Max relates to the stead state current flowing through the diode portion of the PolyZen device in a fault condition, FLT FLT prior to a trip event. I Max is defined as the current at which typical qualification devices (12 parts per lot from 3 lots) survived FLT 100 test cycles. RMS fault currents above I Max may permanently damage the diode portion of the PolyZen device. Testing FLT is conducted with NO load connected to V , such that I = 0. “Test voltage” is defined as the voltage between V to GND OUT OUT IN and includes the PolyZen Diode drop. Specification is dependent on the direction of current flow through the diode. I Max is a FLT survivability rating, not a performance rating. Note 10: The power dissipated by the device when in the “tripped” state, as measured on TE test boards (see note 3). Note 11: Specifications based on limited qualification data and subject to change. MECHANICAL DIMMENSIONS Min Typical Max 3.85 mm 4 mm 4.15 mm Length L (0.152”) (0.16”) (0.163") 3.85 mm 4 mm 4.15 mm Width W (0.152”) (0.16”) (0.163") Height H 1.4mm 1.7 mm 2.0 mm (0.055”) (0.067”) (0.081”) Length 3.0 mm Diode Ld - (0.118”) - Height Hd - 1.0 mm - Diode (0.039”) 0.6 mm Offset O1 - - (0.024”) 0.7 mm Offset O2 - (0.028”) -

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 4 OF 8 SOLDER REFLOW RECOMMENDATIONS: Classification Reflow Profiles Profile Feature Pb-Free Assembly Average Ramp-Up Rate (Tsmax to Tp) 3° C/second max. Preheat • Temperature Min (Tsmin) 150 °C • Temperature Max (Tsmax) 200 °C • Time (tsmin to tsmax) 60-180 seconds Time maintained above: • Temperature (TL) 217 °C • Time (tL) 60-150 seconds Peak/Classification Temperature (Tp) 260 °C Time within 5 °C of actual Peak Temperature (tp) 20-40 seconds Ramp-Down Rate 6 °C/second max. Time 25 °C to Peak Temperature 8 minutes max.

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 5 OF 8 PACKAGING Packaging Tape & Reel Standard Box ZENXXXVXXXAXXLS 3,000 15,000 Reel Dimensions for PolyZen Devices A = 330 max N = 102 min W = 8.4 1 W = 11.1 2 MMaattttee FFiinniisshh TThheessee AArreeaa NNmmiinn AAmmaaxx Taped Component Dimensions for PolyZen Devices

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 6 OF 8 Typical Fault Response: ZEN056V075A48LS 48 V/10 A Current Limited Source (Iout=0) 50 40 A) Vin (V) ( or I 30 VI FoLuTt ( (VA)) V) 20 ( V 10 0 0.00 0.01 0.02 0.03 0.04 Time (sec) Pulse I-V (100 µsec pulse) Pulsed I-V (100 msec pulse) 10 6.00 5.75 5 5.50 ) 5.25 A ( 0 V) 45..7050 FLT (UT 4.50 nt: I -5 O 4.25 e V 4.00 ZEN056V075A48LS rr -10 u 3.75 C 3.50 -15 ZEN056V075A48LS 3.25 3.00 -20 0 0 0 0 0 1 10 100 -1 0 1 2 3 4 5 6 I (A) FLT Voltage: V (V) OUT Time to Trip vs. I RMS (Iout=0) V Peak vs. I RMS (I =0) FLT OUT FLT OUT 6.5 100.0 6.4 ZEN056V075A48LS 6.3 ) V) 6.2 ec10.0 Peak (UT 566...901 o Trip (s 1.0 VO 5.8 e t m 0.1 5.7 Ti ZEN056V075A48LS 5.6 5.5 0.0 0 1 2 3 4 5 6 7 8 9 10 0 1 2 3 4 5 6 7 8 9 10 I RMS (A) FLT I RMS (A) FLT

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 7 OF 8 V Peak vs. I (I =0) Time To Trip vs. I (I =0) OUT FLT OUT FLT OUT 0.0 100.000 -0.2 ZEN056V075A48LS ZEN056V075A48LS 10.000 ) -0.4 ec) V S k ( -0.6 p ( 1.000 ea Tri PT-0.8 To 0.100 OU e V -1.0 m Ti 0.010 -1.2 -1.4 0.001 -40 -30 -20 -10 0 -40 -30 -20 -10 0 IFLT RMS(A) IFLT RMS (A) Time to Trip Vs. I RMS (I = 0) Temperature Effect on I (I = 0) PTC FLT Hold FLT 100 1.50 ZEN056V075A48LS 10 1.25 ) c e ZENxxxV075A48LS A) 1.00 p (s 1 (d 0.75 Tri ol H o 0.1 I 0.50 t e m 0.25 Ti 0.01 0.00 -40 -20 0 20 40 60 80 100 0.001 0 10 20 30 40 Ambient Temperature (C) I RMS (A) PTC Temperature Effect on R TYP 0.50 0.45 0.40 )0.35 s m 0.30 h O0.25 ( YP0.20 T ZENxxxV075A48LS R0.15 0.10 0.05 0.00 20 40 60 80 100 Ambient Temperature (°C)

PRODUCT: ZEN056V075A48LS PolyZen Polymer Enhanced Zener Diode DOCUMENT: SCD27365 Micro-Assemblies REV LETTER: E REV DATE: JUNE 22, 2011 PAGE NO : 8 OF 8 Materials Information ROHS Compliant ELV Compliant Pb-Free Information furnished is believed to be accurate and reliable. However, users should independently evaluate the suitability of each product for their applications. Tyco Electronics Corporation and its affiliates in the TE Connectivity Ltd. group of companies (“TE”) reserves the right to change or update, without notice, any information contained in this publication; to change, without notice, the design, construction, processing, or specification of any product; and to discontinue or limit production or distribution of any product. TE assumes no responsibility for the use of its product or for any infringement of patents or other rights of third parties resulting from the use of its product. No license is granted by implication or otherwise under any patent or proprietary right of TE except the right to use such product for the purpose for which it is sold. This publication supersedes and replaces all information previously supplied. Without expressed or written consent by an officer of TE, TE does not authorize the use of any of its products as components in nuclear facility applications, aerospace, or in critical life support devices or systems. TE’ only obligations are those in the TE Standard Terms and Conditions of Sale and in no case will TE be liable for any incidental, indirect, or consequential damages arising from the sale, resale, use, or misuse of its products. © 2008, 2011 Tyco Electronics Corporation, a TE Connectivity Ltd. Company. All rights reserved.