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STW11NK100Z产品简介:
ICGOO电子元器件商城为您提供STW11NK100Z由STMicroelectronics设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 STW11NK100Z价格参考¥8.10-¥10.13。STMicroelectronicsSTW11NK100Z封装/规格:晶体管 - FET,MOSFET - 单, 通孔 N 沟道 1000V 8.3A(Tc) 230W(Tc) TO-247-3。您可以下载STW11NK100Z参考资料、Datasheet数据手册功能说明书,资料中有STW11NK100Z 详细功能的应用电路图电压和使用方法及教程。
参数 | 数值 |
产品目录 | |
ChannelMode | Enhancement |
描述 | MOSFET N-CH 1KV 8.3A TO-247MOSFET N-Ch 1000 Volt 8.3 A Zener SuperMESH |
产品分类 | FET - 单分离式半导体 |
FET功能 | 标准 |
FET类型 | MOSFET N 通道,金属氧化物 |
Id-ContinuousDrainCurrent | 8.3 A |
Id-连续漏极电流 | 8.3 A |
品牌 | STMicroelectronics |
产品手册 | |
产品图片 | |
rohs | 符合RoHS无铅 / 符合限制有害物质指令(RoHS)规范要求 |
产品系列 | 晶体管,MOSFET,STMicroelectronics STW11NK100ZSuperMESH™ |
数据手册 | |
产品型号 | STW11NK100Z |
Pd-PowerDissipation | 230 W |
Pd-功率耗散 | 230 W |
Qg-GateCharge | 113 nC |
Qg-栅极电荷 | 113 nC |
RdsOn-Drain-SourceResistance | 1.38 Ohms |
RdsOn-漏源导通电阻 | 1.38 Ohms |
Vds-Drain-SourceBreakdownVoltage | 1 kV |
Vds-漏源极击穿电压 | 1 kV |
Vgs-Gate-SourceBreakdownVoltage | +/- 30 V |
Vgs-栅源极击穿电压 | 30 V |
上升时间 | 18 ns |
下降时间 | 55 ns |
不同Id时的Vgs(th)(最大值) | 4.5V @ 100µA |
不同Vds时的输入电容(Ciss) | 3500pF @ 25V |
不同Vgs时的栅极电荷(Qg) | 162nC @ 10V |
不同 Id、Vgs时的 RdsOn(最大值) | 1.38 欧姆 @ 4.15A,10V |
产品目录页面 | |
产品种类 | MOSFET |
供应商器件封装 | TO-247-3 |
其它名称 | 497-3255-5 |
其它有关文件 | http://www.st.com/web/catalog/sense_power/FM100/CL824/SC1168/PF67498?referrer=70071840 |
典型关闭延迟时间 | 98 ns |
功率-最大值 | 230W |
包装 | 管件 |
商标 | STMicroelectronics |
安装类型 | 通孔 |
安装风格 | Through Hole |
封装 | Tube |
封装/外壳 | TO-247-3 |
封装/箱体 | TO-247-3 |
工厂包装数量 | 30 |
晶体管极性 | N-Channel |
最大工作温度 | + 150 C |
最小工作温度 | - 55 C |
标准包装 | 30 |
漏源极电压(Vdss) | 1000V(1kV) |
电流-连续漏极(Id)(25°C时) | 8.3A (Tc) |
系列 | STW11NK100Z |
通道模式 | Enhancement |
配置 | Single |
STW11NK100Z STW11NK100Z Ω N-channel 1000V - 1.1 - 8.3A - TO-247 Zener - Protected SuperMESH™ PowerMOSFET General features V Type DSS R I Pw (@Tjmax) DS(on) D STW11NK100Z 1000 V < 1.38 Ω 8.3 A 230W ■ Extremely high dv/dt capability ■ 100% avalanche tested ■ Gate charge minimized TO-247 ■ Very low intrinsic capacitances ■ Very good manufacturing repeatibility Description The SuperMESH™ series is obtained through an Internal schematic diagram extreme optimization of ST’s well established strip-based PowerMESH™ layout. In addition to pushing on-resistance significantly down, special care is taken to ensure a very good dv/dt capability for the most demanding applications. Such series complements ST full range of high voltage MOSFETs including revolutionary MDmesh™ products. Applications ■ Switching application Order codes Part number Marking Package Packaging STW11NK100Z W11NK100Z TO-247 Tube July 2006 Rev 2 1/14 www.st.com 14
Contents STW11NK100Z Contents 1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 2.1 Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 3 Test circuit Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . 10 4 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 5 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2/14
STW11NK100Z Electrical ratings 1 Electrical ratings Table 1. Absolute maximum ratings Symbol Parameter Value Unit V Drain-source voltage (V = 0) 1000 V DS GS V Drain-gate voltage (R = 20KΩ) 1000 V DGR GS V Gate-source voltage ± 30 V GS I Drain current (continuous) at T = 25°C 8.3 A D C I Drain current (continuous) at T =100°C 5.2 A D C I (1) Drain current (pulsed) 33.2 A DM P Total dissipation at T = 25°C 230 W TOT C Derating Factor 1.85 W/°C V Gate source ESD(HBM-C=100pF, R=1,5KΩ) 6000 V ESD (G-S) dv/dt(2) Peak diode recovery voltage slope 4.5 V/ns TJ Operating junction temperature -55 to 150 °C T Storage temperature stg 1. Pulse width limited by safe operating area 2. I ≤ 8.3 A, di/dt ≤ 200A/µs, V ≤ V , T ≤ T SD DD (BR)DSS j JMAX Table 2. Thermal data Symbol Parameter Value Unit R Thermal resistance junction-case Max 0.54 °C/W thj-case R Thermal resistance junction-ambient Max 50 °C/W thj-a Maximum lead temperature for soldering T 300 °C l purpose Table 3. Avalanche characteristics Symbol Parameter Value Unit Avalanche current, repetitive or not-repetitive I 8.3 A AR (pulse width limited by Tj Max) Single pulse avalanche energy E 550 mJ AS (starting Tj=25°C, Id=Iar, Vdd=50V) 3/14
Electrical ratings STW11NK100Z Table 4. Gate-source zener diode Symbol Parameter Test conditions Min. Typ. Max. Unit BV Gate-source breakdown voltage Igs=± 1mA (Open Drain) 30 0 V GSO Protection features of gate-to-source zener diodes The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components. 4/14
STW11NK100Z Electrical characteristics 2 Electrical characteristics (T =25°C unless otherwise specified) CASE Table 5. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit Drain-source breakdown V I = 1mA, V = 0 1000 V (BR)DSS voltage D GS V = Max rating, Zero gate voltage drain DS 1 µA I V = Max rating, DSS current (VGS = 0) DS 50 µA Tc = 125°C Gate body leakage current IGSS (V = 0) VGS = ± 20V ±10 µA GS V Gate threshold voltage V = V , I = 100µA 3 3.75 4.5 V GS(th) DS GS D Static drain-source on R V = 10V, I = 4.15 A 1.1 1.38 Ω DS(on) resistance GS D Table 6. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit g (1) Forward transconductance V =15V, I = 4.15A 9 S fs DS D Input capacitance C 3500 pF iss Output capacitance C V =25V, f=1 MHz, V =0 270 pF oss DS GS Reverse transfer C 60 pF rss capacitance Equivalent output C (2) V =0, V =0V to 500V 170 pF osseq . capacitance GS DS t Turn-on delay time 27 ns d(on) V =800 V, I = 8A, t Rise time DD D 18 ns r R =4.7Ω, V =10V t Off-voltage rise time G GS 98 ns d(off) (see Figure16) t Fall time 55 ns f Q Total gate charge 113 162 nC g V =800V, I = 8A Q Gate-source charge DD D 18 nC gs V =10V Q Gate-drain charge GS 60 nC gd 1. Pulsed: pulse duration=300µs, duty cycle 1.5% 2. C is defined as a constant equivalent capacitance giving the same charging time as C when V oss eq. oss DS increases from 0 to 80% V DSS 5/14
Electrical characteristics STW11NK100Z Table 7. Source drain diode Symbol Parameter Test conditions Min Typ. Max Unit I Source-drain current 8.3 A SD I (1) Source-drain current (pulsed) 33.2 A SDM V (2) Forward on voltage I =8.3A, V =0 1.6 V SD SD GS I =8.3, t Reverse recovery time SD 560 ns rr di/dt = 100A/µs, Q Reverse recovery charge 4.48 µC rr V =80V, Tj=25°C I Reverse recovery current DD 16 A RRM (see Figure18) I =8A, t Reverse recovery time SD 620 ns rr di/dt = 100A/µs, Q Reverse recovery charge 4.57 µC rr V =80V, Tj=150°C I Reverse recovery current DD 16 A RRM (see Figure18) 1. Pulse width limited by safe operating area 2. Pulsed: pulse duration=300µs, duty cycle 1.5% 6/14
STW11NK100Z Electrical characteristics 2.1 Electrical characteristics (curves) Figure 1. Safe operating area Figure 2. Thermal impedance Figure 3. Output characterisics Figure 4. Transfer characteristics Figure 5. Transconductance Figure 6. Static drain-source on resistance 7/14
Electrical characteristics STW11NK100Z Figure 7. Gate charge vs gate-source voltage Figure 8. Capacitance variations Figure 9. Normalized gate threshold voltage Figure 10. Normalized on resistance vs vs temperature temperature Figure 11. Source-drain diode forward Figure 12. Normalized B vs temperature VDSS characteristics 8/14
STW11NK100Z Electrical characteristics Figure 13. Maximum avalanche energy vs temperature 9/14
Test circuit Package mechanical data STW11NK100Z 3 Test circuit Package mechanical data Figure 14. Unclamped Inductive load test Figure 15. Unclamped Inductive waveform circuit Figure 16. Switching times test circuit for Figure 17. Gate charge test circuit resistive load Figure 18. Test circuit for inductive load switching and diode recovery times 10/14
STW11NK100Z Package mechanical data 4 Package mechanical data In order to meet environmental requirements, ST offers these devices in ECOPACK® packages. These packages have a Lead-free second level interconnect . The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com 11/14
Package mechanical data STW11NK100Z TO-247 MECHANICAL DATA mm. inch DIM. MIN. TYP MAX. MIN. TYP. MAX. A 4.85 5.15 0.19 0.20 A1 2.20 2.60 0.086 0.102 b 1.0 1.40 0.039 0.055 b1 2.0 2.40 0.079 0.094 b2 3.0 3.40 0.118 0.134 c 0.40 0.80 0.015 0.03 D 19.85 20.15 0.781 0.793 E 15.45 15.75 0.608 0.620 e 5.45 0.214 L 14.20 14.80 0.560 0.582 L1 3.70 4.30 0.14 0.17 L2 18.50 0.728 øP 3.55 3.65 0.140 0.143 øR 4.50 5.50 0.177 0.216 S 5.50 0.216 12/14
STW11NK100Z Revision history 5 Revision history T able 8. Revision history Date Revision Changes 21-Jun-2004 1 Preliminary version 31-Jul-2006 2 New template, no content change. 13/14
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