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  • 型号: IPB05N03LA
  • 制造商: Infineon
  • 库位|库存: xxxx|xxxx
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IPB05N03LA产品简介:

ICGOO电子元器件商城为您提供IPB05N03LA由Infineon设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 提供IPB05N03LA价格参考以及InfineonIPB05N03LA封装/规格参数等产品信息。 你可以下载IPB05N03LA参考资料、Datasheet数据手册功能说明书, 资料中有IPB05N03LA详细功能的应用电路图电压和使用方法及教程。

产品参数 图文手册 常见问题
参数 数值
产品目录

分立半导体产品

描述

MOSFET N-CH 25V 80A D2PAK

产品分类

FET - 单

FET功能

逻辑电平门

FET类型

MOSFET N 通道,金属氧化物

品牌

Infineon Technologies

数据手册

http://www.infineon.com/dgdl/IPB05N03LA_Rev1.7_G.pdf?folderId=db3a304412b407950112b408e8c90004&fileId=db3a304412b407950112b42b51a844c4

产品图片

产品型号

IPB05N03LA

PCN过时产品

点击此处下载产品Datasheet

rohs

含铅 / 不符合限制有害物质指令(RoHS)规范要求

产品系列

OptiMOS™

不同Id时的Vgs(th)(最大值)

2V @ 50µA

不同Vds时的输入电容(Ciss)

3110pF @ 15V

不同Vgs时的栅极电荷(Qg)

25nC @ 5V

不同 Id、Vgs时的 RdsOn(最大值)

4.6 毫欧 @ 55A,10V

产品目录页面

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供应商器件封装

PG-TO263-3

其它名称

IPB05N03LAINCT

功率-最大值

94W

包装

剪切带 (CT)

安装类型

表面贴装

封装/外壳

TO-263-3,D²Pak(2 引线+接片),TO-263AB

标准包装

1

漏源极电压(Vdss)

25V

电流-连续漏极(Id)(25°C时)

80A (Tc)

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PDF Datasheet 数据手册内容提取

IPB05N03LA G OptiMOS®2 Power-Transistor Product Summary Features V 25 V DS • Ideal for high-frequency dc/dc converters R (SMD version) 4.6 mΩ DS(on),max • Qualified according to JEDEC1) for target application I 80 A D • N-channel - Logic level • Excellent gate charge x R product (FOM) DS(on) • Very low on-resistance R DS(on) PG-TO263 • Superior thermal resistance • 175 °C operating temperature • dv/dt rated • Pb-free lead plating; RoHS compliant Type Package Marking IPB05N03LA G PG-TO263 05N03LA Maximum ratings, at T=25 °C, unless otherwise specified j Parameter Symbol Conditions Value Unit Continuous drain current I T =25 °C2) 80 A D C T =100 °C 76 C Pulsed drain current I T =25 °C3) 385 D,pulse C Avalanche energy, single pulse E I =72 A, R =25 Ω 190 mJ AS D GS I =80 A, V =20 V, D DS Reverse diode dv/dt dv/dt di/dt=200 A/µs, 6 kV/µs T =175 °C j,max Gate source voltage4) VGS ±20 V Power dissipation P T =25 °C 94 W tot C Operating and storage temperature T, T -55 ... 175 °C j stg IEC climatic category; DIN IEC 68-1 55/175/56 1) J-STD20 and JESD22 Rev. 1. 7 page 1 2006-05-10

IPB05N03LA G Parameter Symbol Conditions Values Unit min. typ. max. Thermal characteristics Thermal resistance, junction - case R - - 1.6 K/W thJC SMD version, device on PCB R minimal footprint - - 62 thJA 6 cm2 cooling area5) - - 40 Electrical characteristics, at T=25 °C, unless otherwise specified j Static characteristics Drain-source breakdown voltage V V =0 V, I =1 mA 25 - - V (BR)DSS GS D Gate threshold voltage V V =V , I =50 µA 1.2 1.6 2 GS(th) DS GS D V =25 V, V =0 V, Zero gate voltage drain current I DS GS - 0.1 1 µA DSS T=25 °C j V =25 V, V =0 V, DS GS - 10 100 T=125 °C j Gate-source leakage current I V =20 V, V =0 V - 1 100 nA GSS GS DS V =4.5 V, I =55 A, Drain-source on-state resistance R GS D - 6.2 7.8 mΩ DS(on) SMD version V =10 V, I =55 A, GS D - 3.8 4.6 SMD version Gate resistance R - 1 - Ω G |V |>2|I |R , Transconductance g DS D DS(on)max 43 86 - S fs I =55 A D 2) Current is limited by bondwire; with an R =1.6 K/W the chip is able to carry 108 thJC 3) See figure 3 4) T =150 °C and duty cycle D<0.25 for j,max V <-5 V GS 5) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 Rev. 1. 7 page 2 2006-05-10

IPB05N03LA G Parameter Symbol Conditions Values Unit min. typ. max. Dynamic characteristics Input capacitance C - 2413 3110 pF iss V =0 V, V =15 V, Output capacitance C GS DS - 921 1225 oss f=1 MHz Reverse transfer capacitance C - 112 167 rss Turn-on delay time t - 11 17 ns d(on) Rise time tr V =15 V, V =10 V, - 27 38 DD GS I =20 A, R =2.7 Ω Turn-off delay time t D G - 32 45 d(off) Fall time t - 4.6 6.9 f Gate Charge Characteristics6) Gate to source charge Q - 8.1 11 nC gs Gate charge at threshold Q - 3.9 5.0 g(th) Gate to drain charge Qgd V =15 V, I =40 A, - 5.3 8.0 DD D V =0 to 5 V Switching charge Q GS - 10 14 sw Gate charge total Q - 19 25 g Gate plateau voltage V - 3.4 - V plateau V =0.1 V, Gate charge total, sync. FET Q DS - 17 22 nC g(sync) V =0 to 5 V GS Output charge Q V =15 V, V =0 V - 20 27 oss DD GS Reverse Diode Diode continous forward current I - - 80 A S T =25 °C C Diode pulse current I - - 385 S,pulse V =0 V, I =80 A, Diode forward voltage V GS F - 0.97 1.2 V SD T=25 °C j V =15 V, I =I , Reverse recovery charge Q R F S - - 10 nC rr di /dt=400 A/µs F 6) See figure 16 for gate charge parameter definition Rev. 1. 7 page 3 2006-05-10

IPB05N03LA G 1 Power dissipation 2 Drain current P =f(T ) I =f(T ); V ≥10 V tot C D C GS 100 100 90 80 80 70 60 60 W] A] P [tot 50 I [D 40 40 30 20 20 10 0 0 0 50 100 150 200 0 50 100 150 200 T [°C] T [°C] C C 3 Safe operating area 4 Max. transient thermal impedance I =f(V ); T =25 °C; D=0 Z =f(t ) D DS C thJC p parameter: t parameter: D=t /T p p 1000 10 1 µs limited by on-state resistance 10 µs 1 0.5 100 0.2 100 µs W] 0.1 A] DC K/ [D [C 0.1 0.05 I 1 ms thJ 0.02 Z 0.01 single pulse 10 10 ms 0.01 1 0.001 0.1 1 10 100 010-6 100-5 100-4 10-03 10-20 10-1 0 100 1 V [V] t [s] DS p Rev. 1. 7 page 4 2006-05-10

IPB05N03LA G 5 Typ. output characteristics 6 Typ. drain-source on resistance I =f(V ); T=25 °C R =f(I ); T=25 °C D DS j DS(on) D j parameter: V parameter: V GS GS 140 25 10 V 4.5 V 3.2 V 3.5 V 3.8 V 4.1 V 120 3 V 20 4.1 V 100 ]Ω 15 80 m A] 3.8 V [ [D on) I 60 DS( R 10 3.5 V 4.5 V 40 5 3.2 V 10 V 20 3 V 2.8 V 0 0 0 1 2 3 0 20 40 60 80 100 120 140 V [V] I [A] DS D 7 Typ. transfer characteristics 8 Typ. forward transconductance I =f(V ); |V |>2|I |R g =f(I ); T=25 °C D GS DS D DS(on)max fs D j parameter: T j 160 120 140 100 120 80 100 A] S] [D 80 [fs 60 I g 60 40 40 20 20 175 °C 25 °C 0 0 0 1 2 3 4 5 0 20 40 60 80 V [V] I [A] GS D Rev. 1. 7 page 5 2006-05-10

IPB05N03LA G 9 Drain-source on-state resistance 10 Typ. gate threshold voltage R =f(T); I =55 A; V =10 V V =f(T); V =V DS(on) j D GS GS(th) j GS DS parameter: I D 10 2.5 9 8 2 7 500 µA m]Ω 6 98 % V] 1.5 R [DS(on) 45 typ V [GS(th) 1 50 µA 3 2 0.5 1 0 0 -60 -20 20 60 100 140 180 -60 -20 20 60 100 140 180 T [°C] T [°C] j j 11 Typ. Capacitances 12 Forward characteristics of reverse diode C=f(V ); V =0 V; f=1 MHz I =f(V ) DS GS F SD parameter: T j 10000 1000 Ciss 175 °C Coss 25 °C 1000 100 175°C 98% pF] A] [ [F C I Crss 100 10 25°C 98% 10 1 0 5 10 15 20 25 30 0.0 0.5 1.0 1.5 2.0 V [V] V [V] DS SD Rev. 1. 7 page 6 2006-05-10

IPB05N03LA G 13 Avalanche characteristics 14 Typ. gate charge I =f(t ); R =25 Ω V =f(Q ); I =40 A pulsed AS AV GS GS gate D parameter: T parameter: V j(start) DD 100 12 25 °C 100 °C 15 V 150 °C 10 5 V 20 V 8 A] V] [V 10 [S 6 A G I V 4 2 1 0 1 10 100 1000 0 10 20 30 40 t [µs] Q [nC] AV gate 15 Drain-source breakdown voltage 16 Gate charge waveforms V =f(T); I =1 mA BR(DSS) j D 29 V GS 28 Q g 27 26 V] [S) 25 S D BR( 24 V V gs(th) 23 22 21 Qg(th) Qsw Qgate Q Q 20 gs gd -60 -20 20 60 100 140 180 T [°C] j Rev. 1. 7 page 7 2006-05-10

IPB05N03LA G PG-TO263-3-2/TO263-3-5/TO263-3-22: Outlines Footprint Packaging Rev. 1. 7 page 8 2006-05-10

IPB05N03LA G Published by Infineon Technologies AG 81726 München, Germany © Infineon Technologies AG 2006. All Rights Reserved. Attention please! The information given in this data sheet shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 1. 7 page 9 2006-05-10