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  • 型号: HAT2168H-EL-E
  • 制造商: RENESAS ELECTRONICS
  • 库位|库存: xxxx|xxxx
  • 要求:
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HAT2168H-EL-E产品简介:

ICGOO电子元器件商城为您提供HAT2168H-EL-E由RENESAS ELECTRONICS设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 HAT2168H-EL-E价格参考。RENESAS ELECTRONICSHAT2168H-EL-E封装/规格:晶体管 - FET,MOSFET - 单, N-Channel 30V 30A (Ta) 15W (Tc) Surface Mount LFPAK。您可以下载HAT2168H-EL-E参考资料、Datasheet数据手册功能说明书,资料中有HAT2168H-EL-E 详细功能的应用电路图电压和使用方法及教程。

产品参数 图文手册 常见问题
参数 数值
产品目录

分立半导体产品

描述

MOSFET N-CH 30V 30A 5LFPAK

产品分类

FET - 单

FET功能

逻辑电平门

FET类型

MOSFET N 通道,金属氧化物

品牌

Renesas Electronics America

数据手册

点击此处下载产品Datasheet

产品图片

产品型号

HAT2168H-EL-E

rohs

无铅 / 符合限制有害物质指令(RoHS)规范要求

产品系列

-

不同Id时的Vgs(th)(最大值)

-

不同Vds时的输入电容(Ciss)

1730pF @ 10V

不同Vgs时的栅极电荷(Qg)

11nC @ 4.5V

不同 Id、Vgs时的 RdsOn(最大值)

7.9 毫欧 @ 15A,10V

供应商器件封装

LFPAK

其它名称

HAT2168H-EL-EDKR

功率-最大值

15W

包装

Digi-Reel®

安装类型

表面贴装

封装/外壳

SC-100,SOT-669

标准包装

1

漏源极电压(Vdss)

30V

电流-连续漏极(Id)(25°C时)

30A (Ta)

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To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid Renesas Electronics document. We appreciate your understanding. Renesas Electronics website: http://www.renesas.com April 1st, 2010 Renesas Electronics Corporation Issued by: Renesas Electronics Corporation (http://www.renesas.com) Send any inquiries to http://www.renesas.com/inquiry.

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HAT2168H Silicon N Channel Power MOS FET Power Switching REJ03G0046-0700 Rev.7.00 Sep 20, 2005 Features • High speed switching • Capable of 4.5 V gate drive • Low drive current • High density mounting • Low on-resistance R = 6 mΩ typ. (at V = 10 V) DS(on) GS Outline RENESAS Package code: PTZZ0005DA-A) (Package name: LFPAK ) 5 D 5 4 4 123 G 1, 2, 3 Source 4 Gate 5 Drain S S S 1 2 3 Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage V 30 V DSS Gate to source voltage V ±20 V GSS Drain current I 30 A D Drain peak current I Note1 120 A D(pulse) Body-drain diode reverse drain current I 30 A DR Avalanche current I Note 2 15 A AP Avalanche energy E Note 2 22 mJ AR Channel dissipation Pch Note3 15 W Channel to Case Thermal Resistance θch-C 8.33 °C/W Channel temperature Tch 150 °C Storage temperature Tstg – 55 to + 150 °C Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tch = 25°C, Rg ≥ 50 Ω 3. Tc = 25°C Rev.7.00 Sep 20, 2005 page 1 of 7

HAT2168H Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V 30 — — V I = 10 mA, V = 0 (BR)DSS D GS Gate to source breakdown voltage V ±20 — — V I = ±100 µA, V = 0 (BR)GSS G DS Gate to source leak current I — — ±10 µA V = ±16 V, V = 0 GSS GS DS Zero gate voltage drain current I — — 1 µA V = 30 V, V = 0 DSS DS GS Gate to source cutoff voltage V 1.0 — 2.5 V V = 10 V, I = 1 mA GS(off) DS D Static drain to source on state R — 6.0 7.9 mΩ I = 15 A, V = 10 V Note4 DS(on) D GS resistance R — 8.8 13.5 mΩ I = 15 A, V = 4.5 V Note4 DS(on) D GS Forward transfer admittance |y | 30 50 — S I = 15 A, V = 10 V Note4 fs D DS Input capacitance Ciss — 1730 — pF V = 10 V, V = 0, DS GS Output capacitance Coss — 400 — pF f = 1 MHz Reverse transfer capacitance Crss — 130 — pF Gate Resistance Rg — 0.55 — Ω Total gate charge Qg — 11 — nC V = 10 V, V = 4.5 V, DD GS Gate to source charge Qgs — 5 — nC ID = 30 A Gate to drain charge Qgd — 2.4 — nC Turn-on delay time t — 8 — ns V = 10 V, I = 15 A, d(on) GS D Rise time tr — 20 — ns VDD ≅ 10 V, RL = 0.67 Ω, Turn-off delay time t — 40 — ns Rg = 4.7 Ω d(off) Fall time t — 4 — ns f Body–drain diode forward voltage V — 0.85 1.10 V IF = 30 A, V = 0 Note4 DF GS Body–drain diode reverse recovery t — 25 — ns IF = 30 A, V = 0 rr GS time di / dt = 100 A/ µs F Notes: 4. Pulse test Rev.7.00 Sep 20, 2005 page 2 of 7

HAT2168H Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area 40 500 W) 10 µs nnel Dissipation Pch ( 321000 Drain Current I (A)D 1001.0011 Otlihmpisiet earadret ibDoayCn i s ROinpDePSrW(aotni o=)n1 1 Tm0c s m= s12050 ° Cµs ha Ta = 25°C C 1 shot Pulse 0.01 0 50 100 150 200 0.1 0.3 1 3 10 30 100 Case Temperature Tc (°C) Drain to Source Voltage VDS (V) Typical Output Characteristics Typical Transfer Characteristics 50 50 10 V V = 10 V 3.2 V DS Pulse Test A) 40 4.5 V 3.0 V A) 40 (D (D nt I 30 2.8 V nt I 30 e e urr 20 2.6 V urr 20 C C n n Tc = 75°C ai ai Dr 10 VGS = 2.4 V Dr 10 25°C Pulse Test -25°C 0 2 4 6 8 10 0 1 2 3 4 5 Drain to Source Voltage VDS (V) Gate to Source Voltage VGS (V) Drain to Source Saturation Voltage vs. Static Drain to Source on State Resistance Gate to Source Voltage vs. Drain Current V) 250 Ω) 100 V (mDS(on) 200 Pulse Test ResistanceR (mDS(on) 50 Pulse Test Drain to Source Voltage 115050000 4 8 12 ID 1=6 201 50A AA20 Drain to Source On State 21002151V1G0S 0V =.3 4.5 V10 3 100 30 1000 Gate to Source Voltage VGS (V) Drain Current ID (A) Rev.7.00 Sep 20, 2005 page 3 of 7

HAT2168H Static Drain to Source on State Resistance Forward Transfer Admittance vs. Ω) vs. Temperature Drain Current stance (mon) 20 Pulse Test | (S)s 100 si S( yf Tc = -25°C Static Drain to Source on State Re RD 1162840-25V1G0S 0 V= 4.52 5V 50 755 AID, 1 1=00 02 A100, 1A 2A205, A5 1A50 Forward Transfer Admittance | 0013..0013310.1 0.3 215°C 3 1VP0Du7Sl5s °=eC3 1T00e sVt 100 Case Temperature Tc (°C) Drain Current I (A) D Body-Drain Diode Reverse Typical Capacitance vs. Recovery Time Drain to Source Voltage 100 10000 s) n me t (rr 50 C (pF) 31000000 Ciss y Ti e 300 Coss Recover 20 pacitanc 100 Crss e a s C ver di/dt = 100 A/µs 30 VGS = 0 Re VGS = 0, Ta = 25°C f = 1 MHz 10 10 0.1 0.3 1 3 10 30 100 0 5 10 15 20 25 30 Reverse Drain Current I (A) Drain to Source Voltage V (V) DR DS Dynamic Input Characteristics Switching Characteristics 50 20 100 (V)S ID = 30 A (V)S td(off) tr Voltage VD 4300 VDS VDD = 21505 VVV VGS 1162 Voltage VG Time t (ns) 1300 td(on) ce 20 8 ce ng Drain to Sour 10 VDD = 21505 VVV 40 Gate to Sour Switchi 13 VRGgS = = 4 1.70 ΩV ,, dVuDtSy =≤ 110 % V tf 0 8 16 24 32 40 0.1 0.3 1 3 10 30 100 Gate Charge Qg (nc) Drain Current I (A) D Rev.7.00 Sep 20, 2005 page 4 of 7

HAT2168H Reverse Drain Current vs. Maximum Avalanche Energy vs. Source to Drain Voltage Channel Temperature Derating J) 50 m 25 Current I (A)DR 4300 150 V V VGS = 0 e Energy E (AR 2105 VdRIAuDgPtD y=≥ = <15 15005 .AΩ1 V % ain 20 nch 10 Dr ala erse 10 e Av 5 v v Re Pulse Test petiti 0 0 0.4 0.8 1.2 1.6 2.0 Re 25 50 75 100 125 150 Source to Drain Voltage V (V) Channel Temperature Tch (°C) SD Normalized Transient Thermal Impedance vs. Pulse Width 3 s (t) γe Tc = 25°C c n 1 a D = 1 d e p m al I 0.3 0.5 m er h 0.2 T nt 0.1 θch - c(t) = γs (t) • θch - c sie 0.1 θch - c = 8.33°C/ W, Tc = 25°C n Tra 0.05 PW ormalized 0.03 0.00.20 1 1shot pulse PDM PTW D = T N 0.01 10 µ 100 µ 1 m 10 m 100 m 1 10 Pulse Width PW (s) Avalanche Test Circuit Avalanche Waveform V 1 DSS E = L • I 2 • V L AR 2 AP VDSS – VDD DS Monitor I AP V Monitor (BR)DSS I AP Rg D. U. T V V DD DS I D Vin 50 Ω 15 V V DD 0 Rev.7.00 Sep 20, 2005 page 5 of 7

HAT2168H Switching Time Test Circuit Switching Time Waveform Vin Monitor Vout 90% Monitor D.U.T. Rg R Vin 10% L Vout 10% 10% Vin VDS 10 V = 10 V 90% 90% td(on) tr td(off) tf Rev.7.00 Sep 20, 2005 page 6 of 7

HAT2168H Package Dimensions JEITA Package Code RENESAS Code Package Name MASS[Typ.] SC-100 PTZZ0005DA-A LFPAK 0.080g Unit: mm 4.9 5.3 Max 4.0 ± 0.2 0.25+–00..0035 3.3 5 1.0 2 3.95 +0.16.1–0.3 4. 1 4 0.20+–00..0035 +0.25–0.20 Max 6 0° – 8°0. 1.3 0.75 Max Max+0.03–0.04 0.10 1 07 1.27 1. 0. 0.40 ± 0.06 0.25M (Ni/Pd/Au plating) Ordering Information Part Name Quantity Shipping Container HAT2168H-EL-E 2500 pcs Taping Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.7.00 Sep 20, 2005 page 7 of 7

Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. Renesas Technology Corp. assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. 3. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Renesas Technology Corp. without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. Renesas Technology Corp. assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information published by Renesas Technology Corp. by various means, including the Renesas Technology Corp. Semiconductor home page (http://www.renesas.com). 4. When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the information and products. 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