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FDMS8333L产品简介:
ICGOO电子元器件商城为您提供FDMS8333L由Fairchild Semiconductor设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 FDMS8333L价格参考。Fairchild SemiconductorFDMS8333L封装/规格:晶体管 - FET,MOSFET - 单, 表面贴装 N 沟道 40V 22A(Ta),76A(Tc) 2.5W(Ta),69W(Tc) 8-PQFN(5x6)。您可以下载FDMS8333L参考资料、Datasheet数据手册功能说明书,资料中有FDMS8333L 详细功能的应用电路图电压和使用方法及教程。
FDMS8333L 是由 ON Semiconductor(安森美半导体)生产的一款单通道 MOSFET(金属氧化物场效应晶体管)。该器件属于 N 沟道增强型 MOSFET,具有低导通电阻和高开关速度的特点,适用于多种电力电子应用。以下是 FDMS8333L 的主要应用场景: 1. 电源管理 FDMS8333L 常用于电源管理电路中,特别是在 DC-DC 转换器、线性稳压器和电池管理系统中。其低导通电阻特性有助于减少功率损耗,提高转换效率。此外,MOSFET 的快速开关能力使其能够在高频开关电源中保持高效运行。 2. 电机驱动 在小型电机驱动应用中,FDMS8333L 可以作为开关元件,控制电机的启动、停止和调速。其低导通电阻和高电流承载能力使其能够承受电机启动时的瞬态大电流,同时保持较低的温升。 3. 负载开关 FDMS8333L 可用于负载开关电路,用于控制电源与负载之间的连接。它可以在需要时迅速切断或接通负载,保护系统免受过流、短路等故障的影响。由于其低导通电阻,负载开关的功耗极低,适合便携式设备和电池供电的应用。 4. 电池保护 在锂电池或其他可充电电池的保护电路中,FDMS8333L 可以用作充放电控制开关。它能够根据电池电压和电流的状态,自动切断或接通充放电回路,防止电池过充、过放或过热,延长电池寿命。 5. 通信设备 在通信设备中,如手机、路由器、基站等,FDMS8333L 可用于电源管理和信号切换。其小尺寸和低功耗特性使其非常适合紧凑型设计,同时确保了系统的稳定性和可靠性。 6. 消费电子 FDMS8333L 还广泛应用于各种消费电子产品中,如平板电脑、笔记本电脑、智能手表等。它能够为这些设备提供高效的电源管理,延长电池续航时间,并确保系统的稳定运行。 总之,FDMS8333L 凭借其出色的电气性能和可靠性,适用于多种电力电子应用,尤其是在对效率和体积有较高要求的场合。
参数 | 数值 |
产品目录 | |
描述 | MOSFET N CH 40V 22A POWER 56MOSFET NChan 40V 76A 69W PowerTrench MOSFET |
产品分类 | FET - 单分离式半导体 |
FET功能 | 逻辑电平门 |
FET类型 | MOSFET N 通道,金属氧化物 |
Id-ContinuousDrainCurrent | 76 A |
Id-连续漏极电流 | 76 A |
品牌 | Fairchild Semiconductor |
产品手册 | |
产品图片 | |
rohs | 符合RoHS无铅 / 符合限制有害物质指令(RoHS)规范要求 |
产品系列 | 晶体管,MOSFET,Fairchild Semiconductor FDMS8333LPowerTrench® |
数据手册 | |
产品型号 | FDMS8333L |
Pd-PowerDissipation | 69 W |
Pd-功率耗散 | 69 W |
Qg-GateCharge | 46 nC |
Qg-栅极电荷 | 46 nC |
RdsOn-Drain-SourceResistance | 3.1 mOhms |
RdsOn-漏源导通电阻 | 3.1 mOhms |
Vds-Drain-SourceBreakdownVoltage | 40 V |
Vds-漏源极击穿电压 | 40 V |
Vgs-Gate-SourceBreakdownVoltage | 20 V |
Vgs-栅源极击穿电压 | 20 V |
Vgsth-Gate-SourceThresholdVoltage | 1.8 V |
Vgsth-栅源极阈值电压 | 1.8 V |
上升时间 | 4.7 ns |
下降时间 | 4.2 ns |
不同Id时的Vgs(th)(最大值) | 3V @ 250µA |
不同Vds时的输入电容(Ciss) | 4545pF @ 20V |
不同Vgs时的栅极电荷(Qg) | 64nC @ 10V |
不同 Id、Vgs时的 RdsOn(最大值) | 3.1 毫欧 @ 22A, 10V |
产品种类 | MOSFET |
供应商器件封装 | Power56 |
其它名称 | FDMS8333LDKR |
典型关闭延迟时间 | 33 ns |
功率-最大值 | 2.5W |
包装 | Digi-Reel® |
单位重量 | 90 mg |
商标 | Fairchild Semiconductor |
安装类型 | 表面贴装 |
安装风格 | SMD/SMT |
封装 | Reel |
封装/外壳 | 8-PowerTDFN |
封装/箱体 | Power 56-8 |
工厂包装数量 | 3000 |
晶体管极性 | N-Channel |
最大工作温度 | + 150 C |
最小工作温度 | - 55 C |
标准包装 | 1 |
正向跨导-最小值 | 120 S |
漏源极电压(Vdss) | 40V |
特色产品 | http://www.digikey.cn/product-highlights/zh/fdms8333l-powertrench/50090http://www.digikey.cn/product-highlights/cn/zh/fairchild-cloud-systems-computing/4301 |
电流-连续漏极(Id)(25°C时) | 22A (Ta), 76A (Tc) |
系列 | FDMS8333L |
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F D M S 8 December 2014 3 3 FDMS8333L 3 L N ® N-Channel PowerTrench MOSFET - C 40 V, 76 A, 3.1 mΩ h a n Features General Description n e (cid:132) Max rDS(on) = 3.1 mΩ at VGS = 10 V, ID = 22 A This N-Channel MOSFET has been designed specifically to l P improve the overall efficiency and to minimize switch node (cid:132) Max r = 4.3 mΩ at V = 4.5 V, I = 19 A o DS(on) GS D ringing of DC/DC converters using either synchronous or w (cid:132) Advanced Package and Silicon combination for low rDS(on) conventional switching PWM controllers. It has been optimized e and high efficiency for low gate charge, low rDS(on), fast switching speed and body rT diode reverse recovery performance. r (cid:132) Next generation enhanced body diode technology, e n engineered for soft recovery Applications c h (cid:132) MSL1 robust package design ® (cid:132) OringFET / Load Switching (cid:132) 100% UIL tested M (cid:132) Synchronous rectification O (cid:132) RoHS Compliant S (cid:132) DC-DC Conversion F E T Top Bottom Pin 1 Pin 1 S S D S S G S D S D D D D G D D Power 56 MOSFET Maximum Ratings TA = 25 °C unless otherwise noted Symbol Parameter Ratings Units V Drain to Source Voltage 40 V DS V Gate to Source Voltage ±20 V GS Drain Current -Continuous T = 25 °C 76 C I -Continuous T = 25 °C (Note 1a) 22 A D A -Pulsed (Note 4) 250 E Single Pulse Avalanche Energy (Note 3) 216 mJ AS Power Dissipation T = 25 °C 69 P C W D Power Dissipation T = 25 °C (Note 1a) 2.5 A T , T Operating and Storage Junction Temperature Range -55 to +150 °C J STG Thermal Characteristics R Thermal Resistance, Junction to Case 1.8 θJC °C/W R Thermal Resistance, Junction to Ambient (Note 1a) 50 θJA Package Marking and Ordering Information Device Marking Device Package Reel Size Tape Width Quantity FDMS8333L FDMS8333L Power 56 13 ’’ 12 mm 3000 units ©2013 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FDMS8333L Rev. C3
F D Electrical Characteristics TJ = 25 °C unless otherwise noted M S Symbol Parameter Test Conditions Min Typ Max Units 8 3 Off Characteristics 3 3 BV Drain to Source Breakdown Voltage I = 250 μA, V = 0 V 40 V L DSS D GS ΔBV Breakdown Voltage Temperature N ΔTDSS Coefficient ID = 250 μA, referenced to 25 °C 22 mV/°C -C J h I Zero Gate Voltage Drain Current V = 32 V, V = 0 V 1 μA DSS DS GS a I Gate to Source Leakage Current V = ±20 V, V = 0 V ±100 nA n GSS GS DS n e On Characteristics l P VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA 1.0 1.8 3.0 V o w ΔV Gate to Source Threshold Voltage GS(th) I = 250 μA, referenced to 25 °C -6 mV/°C e ΔTJ Temperature Coefficient D r T VGS = 10 V, ID = 22 A 2.4 3.1 r e rDS(on) Static Drain to Source On Resistance VGS = 4.5 V, ID = 19 A 3.3 4.3 mΩ n c VGS = 10 V, ID = 22 A, TJ = 125 °C 3.6 4.7 h g Forward Transconductance V = 5 V, I = 22 A 120 S ® FS DS D M Dynamic Characteristics O S C Input Capacitance 3245 4545 pF iss F V = 20 V, V = 0 V, C Output Capacitance DS GS 840 1175 pF E oss f = 1 MHz T C Reverse Transfer Capacitance 32 55 pF rss R Gate Resistance 0.1 0.7 2.1 Ω g Switching Characteristics t Turn-On Delay Time 14 25 ns d(on) tr Rise Time VDD = 20 V, ID = 22 A, 4.7 10 ns td(off) Turn-Off Delay Time VGS = 10 V, RGEN = 6 Ω 33 53 ns t Fall Time 4.2 10 ns f Q Total Gate Charge V = 0 V to 10 V 46 64 nC g GS Qg Total Gate Charge VGS = 0 V to 4.5 V VDD = 20 V, 22 31 nC Qgs Gate to Source Charge ID = 22 A 8.8 nC Q Gate to Drain “Miller” Charge 5.5 nC gd Drain-Source Diode Characteristics V = 0 V, I = 1.9 A (Note 2) 0.7 1.2 V Source to Drain Diode Forward Voltage GS S V SD V = 0 V, I = 22 A (Note 2) 0.8 1.3 GS S t Reverse Recovery Time 38 61 ns rr I = 22 A, di/dt = 100 A/μs Q Reverse Recovery Charge F 20 32 nC rr Notes: 1. RθJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by the user's board design. a.510 in °2C p/aWd wofh e2n o mz ocuonptpeedr o n a b.1m2in5i m°Cu/mW pwahde no fm 2o ouzn tceodp opne ra. GDDSS GDDSS FSFS FSFS 2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%. 3. EAS of 216 mJ is based on starting TJ = 25 °C; N-ch: L = 3 mH, IAS = 12 A, VDD = 40 V, VGS = 10 V. 100% test at L = 0.1 mH, IAS = 38 A. 4. Pulsed Id limited by junction temperature, td<=100 μS, please refer to SOA curve for more details. ©2013 Fairchild Semiconductor Corporation 2 www.fairchildsemi.com FDMS8333L Rev. C3
F D M Typical Characteristics T = 25 °C unless otherwise noted J S 8 3 250 5 3 3 CE V = 3 V L URRENT (A) 125000 VGS =V G 4S V V= G4S.5 = V V10G SV = 3.5 V ALIZEDE ON-RESISTAN 34 GS VGS = 3.5V VGS = 4 V N-Chann I, DRAIN CD150000 PDUULTSYE CV DYGUCS RL=EA 3 T =VI O0.N5 %= 8M0A μXs NORMDRAIN TO SOURC 012 PDUULTSYE C DYUCRLEA T=I O0.N5 %= 8M0A μXs VVGGSS == 140.5 V V el PowerT 0 1 2 3 4 5 0 50 100 150 200 250 re VDS, DRAIN TO SO URCE VOLTAGE (V) ID, DRAIN CURR ENT (A) nc h ® Figure 1. On Region Characteristics Figure 2. Normalized On-Resistance M vs Drain Current and Gate Voltage O S F 1.8 15 E ALIZEDE ON-RESISTANCE 111...246 VIDG =S 2=2 1 A0 V DRAIN TO ()mESISTANCE Ω129 PDUULTSYE C DYUCRLEA T=I O0.N5I D%= = 8M 20A2 μX As T NORM N TO SOURC 01..80 r,DS(on)OURCE ON-R 36 TJ = 125 oC RAI S TJ = 25 oC D 0.6 0 -75 -50 -25 0 25 50 75 100 125 150 2 4 6 8 10 TJ, JUNCTION TEM PERATURE (oC) VGS, GATE TO SOURCE VOLTAGE (V) Figure 3. Normalized On Resistance Figure 4. On-Resistance vs Gate to vs Junction Temperature Source Voltage 250 300 PULSE DURATION = 80 μs A) 100 VGS = 0 V DUTY CYCLE = 0.5% MAX T ( 200 N E T (A) VDS = 5 V URR 10 RREN150 AIN C 1 TJ = 150 oC DRAIN CU100 TJ = 150 oC TJ = 25 oC VERSE DR 0.1 TJ = 25 oC I, D 50 TJ = -55 oC I, RES0.01 TJ = -55 oC 0 0.001 1 2 3 4 5 0.0 0.2 0.4 0.6 0.8 1.0 1.2 VGS, GATE TO SOU RCE VOLTAGE (V) VSD, BODY DIODE FOR WARD VOLTAGE (V) Figure 5. Transfer Characteristics Figure 6. Source to Drain Diode Forward Voltage vs Source Current ©2013 Fairchild Semiconductor Corporation 3 www.fairchildsemi.com FDMS8333L Rev. C3
F D Typical Characteristics M T = 25 °C unless otherwise noted J S 8 3 10 5000 3 E (V) ID = 22 A Ciss 3L G 8 N A TO SOURCE VOLT 46 VDD V=D 1D5 = V 25 VVDD = 20 V APACITANCE (pF)1010000 Coss -Channel P E C o AT 2 w V, GGS 0 10 fV =G S1 =M 0H Vz Crss erT 0 10 20 30 40 50 0.1 1 10 40 re Qg, GATE CH ARGE (nC) VDS, DRAIN TO SOU RCE VOLTAGE (V) n c h ® Figure 7. Gate Charge Characteristics Figure 8. Capacitance vs Drain M to Source Voltage O S F 100 140 E RθJC = 1.8 oC/W T ENT (A) TJ = 25 oC NT (A) 112 R E R R 84 CU UR VGS = 10 V E 10 C H N VALANC TJ = 125 oC TJ = 100 oC , IDRAID 2586 Limited by Package VGS = 4.5 V A , S A I 1 0 0.01 0.01 0.1 1 10 100 500 25 50 75 100 125 150 tAV, TIME IN AVA LANCHE (ms) TC, CASE TEMPERATURE (oC) Figure 9. Unclamped Inductive Figure 10. Maximum Continuous Drain Switching Capability Current vs Case Temperature 1000 10000 W) SINGLE PULSE R ( RθJC = 1.8 oC/W T (A) 100 10 us OWE TC = 25 oC N P RE NT 1000 R THIS AREA IS E N CU 10 LIMITED BY rDS(on) 100 us ANSI AI R DR SINGLE PULSE 1 ms K T I, D 0.11 TTRJCθ J ==C M2=5 A1 oX.C8 R oCA/TWED CMUERAVSEU RBEE NDTA TTAO 1D0C ms , PPEA()PK 15000 0.1 1 10 100 200 10-5 10-4 10-3 10-2 10-1 1 VDS, DRAIN to SOU RCE VOLTAGE (V) t, PULSE WI DTH (sec) Figure 11. Forward Bias Safe Figure 12. Single Pulse Maximum Operating Area Power Dissipation ©2013 Fairchild Semiconductor Corporation 4 www.fairchildsemi.com FDMS8333L Rev. C3
F D Typical Characteristics M T = 25 °C unless otherwise noted J S 8 3 2 3 E 1 DUTY CYCLE-DESCENDING ORDER 3L C FFECTIVERESISTAN 0.1 D = 0000....21055 PDM N-Cha ZED ERMAL 00..0021 t1 nne ALIHE t2 l r(t), NORMRANSIENT T 0.01 SINGLE PULSE ZNRDPθθOeuJJaCtTCyk(E t =C)TS =1yJ: .c=r8l( etPo),C DxDM/ W R =xθ tJZ1C θ/J tC2(t) + TC PowerT T r 0.001 e 10-5 10-4 10-3 10-2 10-1 1 n c t, RECTANGULAR PULSE DURATION (s) h ® Figure 13. Transient Thermal Response Curve M O S F E T ©2013 Fairchild Semiconductor Corporation 5 www.fairchildsemi.com FDMS8333L Rev. C3
PQFN85X6,1.27P CASE483AE ISSUEA 5.10 A 5.10 3.91 PKG SEE CL B DETAILB 1.27 8 5 8 7 6 5 0.77 4.52 3.75 PKGCL 6.15 5.85 6.61 5.65 KEEPOUT AREA 1.27 1 4 1 2 3 4 TOPVIEW 1.27 0.61 3.81 LANDPATTERN OPTIONALDRAFT RECOMMENDATION ANGLEMAYAPPEAR SEE ONFOURSIDES 5.00 4.80 DETAILC OFTHEPACKAGE 0.35 0.15 (cid:19)(cid:131)(cid:16)(cid:20)(cid:21)(cid:131) 0.10 C 0.30 0.05 0.05 SIDEVIEW 0.00 (cid:19)(cid:131)(cid:16)(cid:20)(cid:21)(cid:131) 8X 0.08 C 0.35 C 5.20 0.15 4.80 1.10 SEATING 0.90 PLANE DETAILC DETAILB 3.81 SCALE:2:1 SCALE:2:1 1.27 0.51 (8X) 0.31 (0.34) NOTES:UNLESSOTHERWISESPECIFIED 0.10 C A B A.PACKAGESTANDARDREFERENCE:JEDECMO-240, 1 2 3 4 ISSUEA,VAR.AA,. B.DIMENSIONSDONOTINCLUDEBURRSORMOLDFLASH. 0.76 MOLDFLASHORBURRSDOESNOTEXCEED0.10MM. 0.51 (0.52) C.ALLDIMENSIONSAREINMILLIMETERS. 6.25 D.DIMENSIONINGANDTOLERANCINGPERASMEY14.5M-2009. 5.90 E.ITISRECOMMENDEDTOHAVENOTRACESOR VIASWITHINTHEKEEPOUTAREA. (0.50) 3.48+0.30 -0.10 (0.30) (2X) 8 7 6 5 +0.10 (cid:19)(cid:17)(cid:23)(cid:23)(cid:147)(cid:19)(cid:17)(cid:20)(cid:19) 0.20 (8X) 3.96 -0.15 3.61 BOTTOMVIEW
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