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FDMS7558S产品简介:
ICGOO电子元器件商城为您提供FDMS7558S由Fairchild Semiconductor设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 FDMS7558S价格参考。Fairchild SemiconductorFDMS7558S封装/规格:晶体管 - FET,MOSFET - 单, 表面贴装 N 沟道 25V 32A(Ta),49A(Tc) 2.5W(Ta),89W(Tc) 8-PQFN(5x6)。您可以下载FDMS7558S参考资料、Datasheet数据手册功能说明书,资料中有FDMS7558S 详细功能的应用电路图电压和使用方法及教程。
参数 | 数值 |
产品目录 | |
描述 | MOSFET N-CH 25V 32A POWER56MOSFET 25V N-Channel PowerTrench |
产品分类 | FET - 单分离式半导体 |
FET功能 | 逻辑电平门 |
FET类型 | MOSFET N 通道,金属氧化物 |
Id-连续漏极电流 | 32 A |
品牌 | Fairchild Semiconductor |
产品手册 | |
产品图片 | |
rohs | 符合RoHS无铅 / 符合限制有害物质指令(RoHS)规范要求 |
产品系列 | 晶体管,MOSFET,Fairchild Semiconductor FDMS7558SPowerTrench® |
数据手册 | |
产品型号 | FDMS7558S |
PCN组件/产地 | |
Pd-PowerDissipation | 2.5 W |
Pd-功率耗散 | 2.5 W |
Qg-GateCharge | 85 nC |
Qg-栅极电荷 | 85 nC |
RdsOn-漏源导通电阻 | 1 mOhms |
Vds-漏源极击穿电压 | 25 V |
Vgs-Gate-SourceBreakdownVoltage | 20 V |
Vgs-栅源极击穿电压 | 20 V |
Vgsth-Gate-SourceThresholdVoltage | 1.6 V |
Vgsth-栅源极阈值电压 | 1.6 V |
上升时间 | 9 ns |
下降时间 | 5 ns |
不同Id时的Vgs(th)(最大值) | 3V @ 1mA |
不同Vds时的输入电容(Ciss) | 7770pF @ 13V |
不同Vgs时的栅极电荷(Qg) | 119nC @ 10V |
不同 Id、Vgs时的 RdsOn(最大值) | 1.25 毫欧 @ 32A,10V |
产品目录页面 | |
产品种类 | MOSFET |
供应商器件封装 | Power56 |
其它名称 | FDMS7558SDKR |
典型关闭延迟时间 | 44 ns |
功率-最大值 | 2.5W |
包装 | Digi-Reel® |
单位重量 | 90 mg |
商标 | Fairchild Semiconductor |
安装类型 | 表面贴装 |
安装风格 | SMD/SMT |
导通电阻 | 1 mOhms |
封装 | Reel |
封装/外壳 | 8-PQFN,Power56 |
封装/箱体 | Power 56-8 |
工厂包装数量 | 3000 |
晶体管极性 | N-Channel |
标准包装 | 1 |
正向跨导-最小值 | 221 S |
汲极/源极击穿电压 | 25 V |
漏极连续电流 | 32 A |
漏源极电压(Vdss) | 25V |
特色产品 | http://www.digikey.cn/product-highlights/cn/zh/fairchild-cloud-systems-computing/4301 |
电流-连续漏极(Id)(25°C时) | 32A (Ta), 49A (Tc) |
系列 | FDMS7558S |
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F D M S 7 October 2014 5 5 FDMS7558S 8 S ® TM N N-Channel PowerTrench SyncFET - C 25 V, 49 A, 1.25 mΩ h a Features General Description n n (cid:132) Max r = 1.25 mΩ at V = 10 V, I = 32 A The FDMS7558S has been designed to minimize losses in e DS(on) GS D l power conversion application. Advancements in both silicon and P (cid:132) Max rDS(on) = 1.75 mΩ at VGS = 4.5 V, ID = 28 A package technologies have been combined to offer the lowest o r while maintaining excellent switching performance. This w (cid:132) Advanced Package and Silicon combination for low r DS(on) DS(on) device has the added benefit of an efficient monolithic Schottky e and high efficiency r body diode. T (cid:132) SyncFET Schottky Body Diode re Applications n (cid:132) MSL1 robust package design c (cid:132) Synchronous Rectifier for Synchronous Buck Converters h (cid:132) 100% UIL tested ® (cid:132) Notebook S (cid:132) RoHS Compliant y (cid:132) Server n c (cid:132) Telecom F (cid:132) High Efficiency DC-DC Switch Mode Power Supplies E T Top Bottom Pin 1 S D 5 4 G S S G D 6 3 S D 7 2 S D D D 8 1 S D D Power 56 MOSFET Maximum Ratings TA = 25 °C unless otherwise noted Symbol Parameter Ratings Units V Drain to Source Voltage 25 V DS V Gate to Source Voltage (Note 4) ±20 V GS Drain Current -Continuous (Package limited) T = 25 °C 49 C -Continuous (Silicon limited) T = 25 °C 199 I C A D -Continuous T = 25 °C (Note 1a) 32 A -Pulsed 180 E Single Pulse Avalanche Energy (Note 3) 288 mJ AS Power Dissipation T = 25 °C 89 P C W D Power Dissipation T = 25 °C (Note 1a) 2.5 A T , T Operating and Storage Junction Temperature Range -55 to +150 °C J STG Thermal Characteristics R Thermal Resistance, Junction to Case 1.4 θJC °C/W R Thermal Resistance, Junction to Ambient (Note 1a) 50 θJA Package Marking and Ordering Information Device Marking Device Package Reel Size Tape Width Quantity FDMS7558S FDMS7558S Power 56 13 ’’ 12 mm 3000 units ©2011 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FDMS7558S Rev.C3
F D Electrical Characteristics T = 25 °C unless otherwise noted M J S Symbol Parameter Test Conditions Min Typ Max Units 7 5 Off Characteristics 5 8 S BV Drain to Source Breakdown Voltage I = 1 mA, V = 0 V 25 V DSS D GS N ΔBV Breakdown Voltage Temperature ΔTDSS Coefficient ID = 10 mA, referenced to 25 °C 21 mV/°C -C J h IDSS Zero Gate Voltage Drain Current VDS = 20 V, VGS = 0 V 500 μA a n I Gate to Source Leakage Current, Forward V = 20 V, V = 0 V 100 nA GSS GS DS n e On Characteristics (Note 2) l P V Gate to Source Threshold Voltage V = V , I = 1 mA 1.2 1.6 3.0 V o GS(th) GS DS D w ΔV Gate to Source Threshold Voltage GS(th) I = 10 mA, referenced to 25 °C -5 mV/°C e ΔT Temperature Coefficient D r J T V = 10 V, I = 32 A 1.0 1.25 r GS D e r Static Drain to Source On Resistance V = 4.5 V, I = 28 A 1.4 1.75 mΩ n DS(on) GS D c VGS = 10 V, ID = 32 A, TJ = 125 °C 1.4 1.8 h ® g Forward Transconductance V = 5 V, I = 32 A 221 S FS DS D S Dynamic Characteristics y n C Input Capacitance 5843 7770 pF c iss C Output Capacitance VDS = 13 V, VGS = 0 V, 1615 2150 pF F oss f = 1 MHz E Crss Reverse Transfer Capacitance 317 475 pF T R Gate Resistance 0.5 1.0 Ω g Switching Characteristics t Turn-On Delay Time 18 33 ns d(on) tr Rise Time VDD = 13 V, ID = 32 A, 9 18 ns td(off) Turn-Off Delay Time VGS = 10 V, RGEN = 6 Ω 44 70 ns t Fall Time 5 10 ns f Q Total Gate Charge V = 0 V to 10 V 85 119 nC g GS Qg Total Gate Charge VGS = 0 V to 4.5 V VDD = 13 V, 39 55 nC Qgs Gate to Source Gate Charge ID = 32 A 16.5 nC Q Gate to Drain “Miller” Charge 9.7 nC gd Drain-Source Diode Characteristics V = 0 V, I = 2 A (Note 2) 0.38 0.7 V Source to Drain Diode Forward Voltage GS S V SD V = 0 V, I = 32 A (Note 2) 0.75 1.2 GS S t Reverse Recovery Time 39 63 ns rr I = 32 A, di/dt = 300 A/μs Q Reverse Recovery Charge F 52 84 nC rr Notes: 1. RθJA is determined with the device mounted on a 1in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by the user's board design. a. 50 °C/W when mounted on a b. 125 °C/W when mounted on a 1 in2 pad of 2 oz copper. minimum pad of 2 oz copper. 2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%. 3. EAS of 288 mJ is based on starting TJ = 25 °C, L = 1 mH, IAS = 24 A, VDD = 23 V, VGS = 10 V. 100% test at L = 0.3 mH, IAS = 35 A. 4. As an N-ch device, the negative Vgs rating is for low duty cycle pulse occurrence only. No continuous rating is implied. FDMS7558S Rev.C3 2 www.fairchildsemi.com
F D Typical Characteristics M T = 25 °C unless otherwise noted J S 7 5 180 20 5 T (A) 112500 VGVSG =S =4 . 51 0V V PDUULTSYE C DYUCRLEA T=I O0.N5 %= 8M0A μXs ESISTANCE 16 VGS = 2.5 VVGS = 3 V PDUULTSYE C DYUCRLEA T=I O0.N5 %= 8M0A μXs 8S N-C I, DRAIN CURREND 369000 VGS = 3.5 V VVGGSS == 32 .V5 V NORMALIZEDAIN TO SOURCE ON-R 1482 VGS = 3.5 V VGS = 4.5 V VGS = 10 V hannel Powe R 0 D 0 rT 0 1 2 3 4 5 0 30 60 90 120 150 180 r e VDS, DRAIN TO SO URCE VOLTAGE (V) ID, DRAIN CURR ENT (A) n c Figure 1. On Region Characteristics Figure 2. Normalized On-Resistance h ® vs Drain Current and Gate Voltage S y 1.5 5 n ANCE 1.4 VIDG =S 3=2 1 A0 V )mΩ 4 PDUULTSYE C DYUCRLEA T=I O0.N5 %= 8M0A μXs cFE ALIZEDE ON-RESIST 111...123 DRAIN TO (ESISTANCE 3 ID = 32 A T NORM AIN TO SOURC 001...890 r,DS(on)SOURCE ON-R 12 TTJ J= = 1 2255 ooCC R D 0.7 0 -75 -50 -25 0 25 50 75 100 125 150 2 4 6 8 10 TJ, JUNCTION TEM PERATURE (oC) VGS, GATE TO SOURCE VOLTAGE (V) Figure 3. Normalized On Resistance Figure 4. On-Resistance vs Gate to vs Junction Temperature Source Voltage 180 200 150 PDUULTSYE C DYUCRLEA T=I O0.N5 %= 8M0A μXs T (A) 100 VGS = 0 V N E T (A)120 VDS = 5 V URR 10 TJ = 125 oC N C E N URR 90 RAI 1 TJ = 25 oC RAIN C 60 TJ = 125 oC ERSE D TJ = -55 oC I, DD 30 TJ = 25 oC , REVS 0.1 TJ = -55 oC I 0 0.01 1.5 2.0 2.5 3.0 3.5 0.0 0.2 0.4 0.6 0.8 1.0 VGS, GATE TO SOU RCE VOLTAGE (V) VSD, BODY DIODE FOR WARD VOLTAGE (V) Figure 5. Transfer Characteristics Figure 6. Source to Drain Diode Forward Voltage vs Source Current FDMS7558S Rev.C3 3 www.fairchildsemi.com
F D Typical Characteristics M T = 25 °C unless otherwise noted J S 7 5 10 8000 5 GE (V) 8 ID = 32 A Ciss 8S A N OLT VDD = 13 V pF) -C O SOURCE V 46 VDD = 10 V VDD = 16 V PACITANCE (1000 Coss hannel E T CA P T 2 o A G f = 1 MHz w V, GS 0 200 VGS = 0 V Crss erT 0 15 30 45 60 75 90 0.1 1 10 30 r Qg, GATE CH ARGE (nC) VDS, DRAIN TO SOU RCE VOLTAGE (V) en c Figure 7. Gate Charge Characteristics Figure 8. Capacitance vs Drain h to Source Voltage ® S y n 40 200 c F ENT (A) TJ = 25 oC NT (A) 150 VGS = 10 V ET RR 10 RE HE CU TJ = 100 oC N CUR 100 VGS = 4.5 V VALANC TJ = 125 oC , IDRAID 50 A , AS Limited by Package RθJC = 1.4 oC/W I 1 0 0.01 0.1 1 10 100 1000 25 50 75 100 125 150 tAV, TIME IN AVA LANCHE (ms) TC, CASE TEMPERATURE (oC) Figure 9. Unclamped Inductive Switching Capability Figure 10. Maximum Continuous Drain Current vs Case Temperature 300 1000 100 R (W) SRIθNJAG =L E1 2P5U oLCS/WE NT (A) 10 1 ms POWE 100 TA = 25 oC RAIN CURRE 1 TLHIMISIT AERDE BAY I SrSD ISN(GonL)E PULSE 11100s 0m mss TRANSIENT 10 I, DD 0.1 RTTJAθ J ==A M2=5 A1 Xo2C5 R oACT/WED 1D0Cs , PEAK )PK 1 0.01 P( 0.5 0.01 0.1 1 10 100 10-3 10-2 10-1 1 10 100 1000 VDS, DRAIN to SOU RCE VOLTAGE (V) t, PULSE WIDT H (sec) Figure 11. Forward Bias Safe Figure 12. Single Pulse Maximum Operating Area Power Dissipation FDMS7558S Rev.C3 4 www.fairchildsemi.com
F D Typical Characteristics M T = 25 °C unless otherwise noted J S 7 5 2 5 DUTY CYCLE-DESCENDING ORDER 8 1 S N AL -C RMALIZED THERM IMPEDANCE,ZJAθ 00.0.11 D = 000000......210005521 PDM t1t2 hannel Po NO SRIθNJAG =L E1 2P5U oLCS/WE NDPEOUATTYKE SFT:AJ C= TPODRM: xD Z =θ JtA1 /xt2 RθJA + TA wer T 0.001 re 10-3 10-2 10-1 1 10 100 1000 n c t, RECTANGULAR PULSE DURATION (sec) h ® Figure 13. Junction-to-Ambient Transient Thermal Response Curve S y n c F E T FDMS7558S Rev.C3 5 www.fairchildsemi.com
F D Typical Characteristics (continued) M S 7 5 5 SyncFET Schottky body diode 8 S Characteristics N - C Fairchild’s SyncFET process embeds a Schottky diode in parallel Schottky barrier diodes exhibit significant leakage at high temper- h with PowerTrench MoSFET. This diode exhibits similar a characteristics to a discrete external Schottky diode in parallel ature and high reverse voltage. This will increase the power in the n n with a MOSFET. Figure 14 shows the reverses recovery device. e characteristic of the FDMS7558S. l P o w 35 10-2 er A) T 30 NT ( TJ = 125 oC re 25 URRE10-3 TJ = 100 oC nch A) 20 C ® CURRENT ( 1105 di/dt = 300 A/μs E LEAKAGE 10-4 Sync 5 VERS10-5 TJ = 25 oC FE 0 RE T -5 , DSS10-6 0 5 10 15 20 25 I 0 5 10 15 20 25 TIME (ns) VDS, REVERSE VOLTAGE (V) Figure 14. FDMS7558S SyncFET body Figure 15. SyncFET body diode reverses diode reverse recovery characteristic leakage versus drain-source voltage FDMS7558S Rev.C3 6 www.fairchildsemi.com
PQFN85X6,1.27P CASE483AE ISSUEA 5.10 A 5.10 3.91 PKG SEE CL B DETAILB 1.27 8 5 8 7 6 5 0.77 4.52 3.75 PKGCL 6.15 5.85 6.61 5.65 KEEPOUT AREA 1.27 1 4 1 2 3 4 TOPVIEW 1.27 0.61 3.81 LANDPATTERN OPTIONALDRAFT RECOMMENDATION ANGLEMAYAPPEAR SEE ONFOURSIDES 5.00 4.80 DETAILC OFTHEPACKAGE 0.35 0.15 (cid:19)(cid:131)(cid:16)(cid:20)(cid:21)(cid:131) 0.10 C 0.30 0.05 0.05 SIDEVIEW 0.00 (cid:19)(cid:131)(cid:16)(cid:20)(cid:21)(cid:131) 8X 0.08 C 0.35 C 5.20 0.15 4.80 1.10 SEATING 0.90 PLANE DETAILC DETAILB 3.81 SCALE:2:1 SCALE:2:1 1.27 0.51 (8X) 0.31 (0.34) NOTES:UNLESSOTHERWISESPECIFIED 0.10 C A B A.PACKAGESTANDARDREFERENCE:JEDECMO-240, 1 2 3 4 ISSUEA,VAR.AA,. B.DIMENSIONSDONOTINCLUDEBURRSORMOLDFLASH. 0.76 MOLDFLASHORBURRSDOESNOTEXCEED0.10MM. 0.51 (0.52) C.ALLDIMENSIONSAREINMILLIMETERS. 6.25 D.DIMENSIONINGANDTOLERANCINGPERASMEY14.5M-2009. 5.90 E.ITISRECOMMENDEDTOHAVENOTRACESOR VIASWITHINTHEKEEPOUTAREA. (0.50) 3.48+0.30 -0.10 (0.30) (2X) 8 7 6 5 +0.10 (cid:19)(cid:17)(cid:23)(cid:23)(cid:147)(cid:19)(cid:17)(cid:20)(cid:19) 0.20 (8X) 3.96 -0.15 3.61 BOTTOMVIEW
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