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BSC018NE2LSI产品简介:
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参数 | 数值 |
产品目录 | |
描述 | MOSFET N-CH 25V 29A TDSON-8 |
产品分类 | FET - 单 |
FET功能 | 逻辑电平门 |
FET类型 | MOSFET N 通道,金属氧化物 |
品牌 | Infineon Technologies |
数据手册 | http://www.infineon.com/dgdl/BSC018NE2LSI_Rev+2.2.pdf?folderId=db3a304313b8b5a60113cee8763b02d7&fileId=db3a30433072cd8f013093b8abf971c2 |
产品图片 | |
产品型号 | BSC018NE2LSI |
rohs | 无铅 / 符合限制有害物质指令(RoHS)规范要求 |
产品系列 | OptiMOS™ |
不同Id时的Vgs(th)(最大值) | 2V @ 250µA |
不同Vds时的输入电容(Ciss) | 2500pF @ 12V |
不同Vgs时的栅极电荷(Qg) | 36nC @ 10V |
不同 Id、Vgs时的 RdsOn(最大值) | 1.8 毫欧 @ 30A,10V |
供应商器件封装 | PG-TDSON-8 |
其它名称 | BSC018NE2LSIDKR |
功率-最大值 | 69W |
包装 | Digi-Reel® |
安装类型 | 表面贴装 |
封装/外壳 | 8-PowerTDFN |
标准包装 | 1 |
漏源极电压(Vdss) | 25V |
电流-连续漏极(Id)(25°C时) | 29A (Ta), 100A (Tc) |
BSC018NE2LS OptiMOSTM Power-MOSFET Product Summary Features V 25 V DS • Optimized for high performance Buck converter R 1.8 mW DS(on),max • Very low on-resistance R @ V =4.5 V DS(on) GS I 100 A D • 100% avalanche tested Q 21 nC OSS • Superior thermal resistance Q (0V..10V) 39 nC G • N-channel • Qualified according to JEDEC1) for target applications PG-TDSON-8 • Pb-free lead plating; RoHS compliant • Halogen-free according to IEC61249-2-21 Type Package Marking BSC018NE2LS PG-TDSON-8 018NE2LS Maximum ratings, at T =25 °C, unless otherwise specified j Parameter Symbol Conditions Value Unit Continuous drain current I V =10 V, T =25 °C 100 A D GS C V =10 V, T =100 °C 97 GS C V =4.5 V, T =25 °C 100 GS C V =4.5 V, GS 86 T =100 °C C V =10 V, T =25 °C, GS A 29 R =50 K/W2) thJA Pulsed drain current3) ID,pulse TC=25 °C 400 Avalanche current, single pulse4) IAS TC=25 °C 50 Avalanche energy, single pulse E I =50 A, R =25 W 80 mJ AS D GS Gate source voltage V ±20 V GS 1) J-STD20 and JESD22 Rev. 2.2 page 1 2013-02-12
BSC018NE2LS Maximum ratings, at T =25 °C, unless otherwise specified j Parameter Symbol Conditions Value Unit Power dissipation P T =25 °C 69 W tot C T =25 °C, A 2.5 R =50 K/W2) thJA Operating and storage temperature T , T -55 ... 150 °C j stg IEC climatic category; DIN IEC 68-1 55/150/56 Parameter Symbol Conditions Values Unit min. typ. max. Thermal characteristics Thermal resistance, junction - case R - - 1.8 K/W thJC top - - 20 Device on PCB RthJA 6 cm2 cooling area2) - - 50 Electrical characteristics, at T =25 °C, unless otherwise specified j Static characteristics Drain-source breakdown voltage V V =0 V, I =1 mA 25 - - V (BR)DSS GS D Gate threshold voltage V V =V , I =250 µA 1.2 - 2.0 GS(th) DS GS D V =25 V, V =0 V, Zero gate voltage drain current I DS GS - 0.1 1 µA DSS T =25 °C j V =25 V, V =0 V, DS GS - 10 100 T =125 °C j Gate-source leakage current I V =20 V, V =0 V - 10 100 nA GSS GS DS Drain-source on-state resistance R V =4.5 V, I =30 A - 1.8 2.3 mW DS(on) GS D V =10 V, I =30 A - 1.5 1.8 GS D Gate resistance R 0.3 0.7 1.4 W G |V |>2|I |R , Transconductance g DS D DS(on)max 70 140 - S fs I =30 A D 2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. 3) See figure 3 for more detailed information Rev. 2.2 page 2 2013-02-12
BSC018NE2LS Parameter Symbol Conditions Values Unit min. typ. max. Dynamic characteristics Input capacitance C - 2800 3700 pF iss V =0 V, V =12 V, Output capacitance C GS DS - 1000 1300 oss f=1 MHz Reverse transfer capacitance C - 110 - rss Turn-on delay time t - 5.5 - ns d(on) Rise time tr V =12 V, V =10 V, - 4.4 - DD GS I =30 A, R =1.6 W Turn-off delay time t D G - 26 - d(off) Fall time t - 3.6 - f Gate Charge Characteristics5) Gate to source charge Q - 7.0 9.2 nC gs Gate charge at threshold Q - 4.5 6.0 g(th) Gate to drain charge Qgd V =12 V, I =30 A, - 4.3 6.4 DD D V =0 to 4.5 V Switching charge Q GS - 6.7 9.6 sw Gate charge total Q - 19 25 g Gate plateau voltage V - 2.5 - V plateau V =12 V, I =30 A, Gate charge total Q DD D - 39 51 nC g V =0 to 10 V GS V =0.1 V, Gate charge total, sync. FET Q DS - 16 22 g(sync) V =0 to 4.5 V GS Output charge Q V =12 V, V =0 V - 21 28 oss DD GS Reverse Diode Diode continuous forward current I - - 69 A S T =25 °C C Diode pulse current I - - 250 S,pulse V =0 V, I =30 A, Diode forward voltage V GS F - 0.85 1 V SD T =25 °C j V =15 V, I =I , Reverse recovery charge Q R F S - 20 - nC rr di /dt=400 A/µs F 4) See figure 13 for more detailed information 5) See figure 16 for gate charge parameter definition Rev. 2.2 page 3 2013-02-12
BSC018NE2LS 1 Power dissipation 2 Drain current P =f(T ) I =f(T ); V ≥10 V tot C D C GS 80 120 70 100 60 80 50 ] P [Wtot 40 I [A] D 60 30 40 20 20 10 0 0 0 40 80 120 160 0 40 80 120 160 T [°C] T [°C] C C 3 Safe operating area 4 Max. transient thermal impedance I =f(V ); T =25 °C; D=0 Z =f(t ) D DS C thJC p parameter: t parameter: D=t /T p p 103 101 limited by on-state 1 µs resistance 10 µs 100 µs 102 1 ms 100 0.5 10 ms W] A] 101 K/ 0.2 [D DC [C I J 0.1 h Zt 0.05 10-1 0.02 100 0.01 single pulse 10-1 10-2 10-1 100 101 102 10-6 10-5 10-4 10-3 10-2 10-1 100 V [V] t [s] DS p Rev. 2.2 page 4 2013-02-12
BSC018NE2LS 5 Typ. output characteristics 6 Typ. drain-source on resistance I =f(V ); T =25 °C R =f(I ); T =25 °C D DS j DS(on) D j parameter: V parameter: V GS GS 4 400 5 V 10 V 350 4.5 V 3 300 3.5 V 3.3 V 250 ] W m I [A] D 200 3.2 V [S(on) 2 4 V 4.5 V D 5 V R 7 V 150 8 V 3 V 10 V 100 1 2.8 V 50 0 0 0 1 2 3 0 10 20 30 40 50 V [V] I [A] DS D 7 Typ. transfer characteristics 8 Typ. forward transconductance I =f(V ); |V |>2|I |R g =f(I ); T =25 °C D GS DS D DS(on)max fs D j parameter: T j 400 300 250 320 200 240 A] S] I [D g [fs 150 160 100 150 °C 80 50 25 °C 0 0 0 1 2 3 4 5 0 40 80 120 160 V [V] I [A] GS D Rev. 2.2 page 5 2013-02-12
BSC018NE2LS 9 Drain-source on-state resistance 10 Typ. gate threshold voltage R =f(T ); I =30 A; V =10 V V =f(T ); V =V ; I =250 µA DS(on) j D GS GS(th) j GS DS D 2.5 2.5 2.0 2 ] typ mW 1.5 V] 1.5 [S(on) [GS(th) D V R 1.0 1 0.5 0.5 0.0 0 -60 -20 20 60 100 140 180 -60 -20 20 60 100 140 180 T [°C] T [°C] j j 11 Typ. capacitances 12 Forward characteristics of reverse diode C=f(V ); V =0 V; f=1 MHz I =f(V ) DS GS F SD parameter: T j 104 10000 102 Ciss 103 1000 Coss 150 °C 25 °C F] A] C [p I [F 101 102 100 Crss 101 10 100 0 5 10 15 20 25 0 0.2 0.4 0.6 0.8 1 V [V] V [V] DS SD Rev. 2.2 page 6 2013-02-12
BSC018NE2LS 13 Avalanche characteristics 14 Typ. gate charge I =f(t ); R =25 W V =f(Q ); I =30 A pulsed AS AV GS GS gate D parameter: T parameter: V j(start) DD 100 12 12 V 10 5 V 20 V 25 °C 100 °C 8 125 °C [A] V 10 [V] GS 6 A V I 4 2 1 0 1 10 100 1000 0 10 20 30 40 50 t [µs] Q [nC] AV gate 15 Drain-source breakdown voltage 16 Gate charge waveforms V =f(T ); I =1 mA BR(DSS) j D 28 V GS 27 Q g 26 V] 25 [S) S D 24 R( B V V gs(th) 23 22 21 Qg(th) Qsw Qgate Q Q 20 gs gd -60 -20 20 60 100 140 180 T [°C] j Rev. 2.2 page 7 2013-02-12
BSC018NE2LS Package Outline PG-TDSON-8 PG-TDSON-8: Outline Rev. 2.2 page 8 2013-02-12
BSC018NE2LS Package Outline PG-TDSON-8: Tape Dimensions in mm Rev. 2.2 page 9 2013-02-12
BSC018NE2LS Published by Infineon Technologies AG 81726 Munich, Germany © 2010 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 2.2 page 10 2013-02-12
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