Dual-Axis ±5 g Accelerometer with SPI Interface Data Sheet ADIS16006 FEATURES GENERAL DESCRIPTION Dual-axis accelerometer The ADIS16006 is a low cost, low power, complete dual-axis SPI digital output interface accelerometer with an integrated serial peripheral interface Internal temperature sensor (SPI). An integrated temperature sensor is also available on the Highly integrated; minimal external components SPI interface. The ADIS16006 measures acceleration with a full- Bandwidth externally selectable scale range of ±5 g (minimum). The ADIS16006 can measure both 1.9 mg resolution at 60 Hz dynamic acceleration (vibration) and static acceleration (gravity). Externally controlled electrostatic self-test The typical noise floor is 200 µg/√Hz, allowing signals below 3.0 V to 5.25 V single-supply operation 1.9 mg (60 Hz bandwidth) to be resolved. Low power: <2 mA 3500 g shock survival The bandwidth of the accelerometer is set with optional 7.2 mm × 7.2 mm × 3.7 mm package capacitors, CX and CY, at the XFILT pin and the YFILT pin. Digital output data for both axes is available via the serial interface. APPLICATIONS An externally driven self-test pin (ST) allows the user to verify the accelerometer functionality. Industrial vibration/motion sensing The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.7 mm, Platform stabilization Dual-axis tilt sensing 12-terminal LGA package. Tracking, recording, analysis devices Alarms and security devices FUNCTIONAL BLOCK DIAGRAM VCC ADIS16006 SCLK DUA±L5-gAXIS SERIAL DIN ACCELEROMETER INTERFACE DOUT CS CDC TCS TEMP SENSOR COM ST YFILT XFILT CY CX 05975-001 Figure 1. Rev. C Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Tel: 781.329.4700 ©2006–2013 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com

ADIS16006 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Accelerometer Data Format ...................................................... 11 Applications ....................................................................................... 1 Self-Test ....................................................................................... 11 General Description ......................................................................... 1 Serial Interface ............................................................................ 11 Functional Block Diagram .............................................................. 1 Accelerometer Serial Interface.................................................. 11 Revision History ............................................................................... 2 Temperature Sensor Serial Interface ........................................ 12 Specifications ..................................................................................... 3 Power Supply Decoupling ......................................................... 12 Timing Specifications .................................................................. 4 Setting the Bandwidth ............................................................... 13 Circuit and Timing Diagrams ..................................................... 5 Selecting Filter Characteristics: The Noise/Bandwidth Trade- Absolute Maximum Ratings ............................................................ 6 Off ................................................................................................. 13 Applications ..................................................................................... 15 ESD Caution .................................................................................. 6 Pin Configuration and Function Descriptions ............................. 7 Second Level Assembly.............................................................. 15 Outline Dimensions ....................................................................... 16 Typical Performance Characteristics ............................................. 8 Theory of Operation ...................................................................... 11 Ordering Guide .......................................................................... 16 REVISION HISTORY 2/13—Rev. B to Rev. C Changes to Figure 23 ...................................................................... 14 3/12—Rev. A to Rev. B Added Accelerometer Data Format Section ............................... 11 Added Table 6; Renumbered Sequentially .................................. 11 10/07—Rev. 0 to Rev. A Changes to Features and General Description ............................. 1 Added Note 6 to Table 2 .................................................................. 4 Changes to Figure 5 .......................................................................... 6 Changes to Accelerometer Control Register Section ................. 11 Changes to Layout .......................................................................... 13 Changes to Layout .......................................................................... 14 Deleted Figure 24 and Table 11..................................................... 14 Edited Second-Level Assembly Section ....................................... 15 Updated Outline Dimensions ....................................................... 16 Changes to Ordering Guide .......................................................... 16 3/06—Revision 0: Initial Version Rev. C | Page 2 of 16

Data Sheet ADIS16006 SPECIFICATIONS T = −40°C to +125°C, V = 5 V, C = C = 0 µF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications A CC X Y are guaranteed. Typical specifications are not guaranteed. Table 1. Parameter Conditions Min Typ Max Unit ACCELEROMETER SENSOR INPUT Each axis Measurement Range1 ±5 g Nonlinearity % of full scale ±0.5 ±2.5 % Package Alignment Error ±1.5 Degrees Alignment Error X sensor to Y sensor ±0.1 Degrees Cross-Axis Sensitivity ±1.5 ±3 % ACCELEROMETER SENSITIVITY Each axis Sensitivity at XFILT, YFILT 242 256 272 LSB/g Sensitivity Change due to Temperature2 Delta from 25°C ±0.3 % ZERO g BIAS LEVEL Each axis 0 g Voltage at XFILT, YFILT 1905 2048 2190 LSB 0 g Offset vs. Temperature ±0.1 LSB/°C ACCELEROMETER NOISE PERFORMANCE Noise Density At 25°C 200 µg/√Hz rms ACCELEROMETER FREQUENCY RESPONSE3, 4 C , C Range 0 10 µF X Y R Tolerance 24 32 40 kΩ FILT Sensor Bandwidth C = 0 µF, C = 0 µF 2.26 kHz X Y Sensor Resonant Frequency 5.5 kHz ACCELEROMETER SELF-TEST Logic Input Low 0.2 × V V CC Logic Input High 0.8 × V V CC ST Input Resistance to COM 30 50 kΩ Output Change at X , Y 5 Self-Test 0 to Self-Test 1 102 205 307 LSB OUT OUT TEMPERATURE SENSOR Accuracy V = 3 V to 5.25 V ±2 °C CC Resolution 10 Bits Update Rate 400 µs Temperature Conversion Time 25 µs DIGITAL INPUT Input High Voltage (V ) V = 4.75 V to 5.25 V 2.4 V INH CC V = 3.0 V to 3.6 V 2.1 V CC Input Low Voltage (V ) V = 3.0 V to 5.25 V 0.8 V INL CC Input Current V = 0 V or V −10 +1 +10 µA IN CC Input Capacitance 10 pF DIGITAL OUTPUT Output High Voltage (V ) I = 200 µA, V = 3.0 V to 5.25 V V − 0.5 V OH SOURCE CC CC Output Low Voltage (V ) I = 200 µA 0.4 V OL SINK Rev. C | Page 3 of 16

ADIS16006 Data Sheet Parameter Conditions Min Typ Max Unit POWER SUPPLY Operating Voltage Range 3.0 5.25 V Quiescent Supply Current f = 50 kSPS 1.5 1.9 mA SCLK Power-Down Current 1.0 mA Turn-On Time6 C , C = 0.1 µF 20 ms X Y 1 Guaranteed by measurement of initial offset and sensitivity. 2 Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature. 3 Actual bandwidth response controlled by user-supplied external capacitor (CX, CY). 4 See the Setting the Bandwidth section for more information on how to reduce the bandwidth. 5 Self-test response changes as the square of VCC. 6 Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 × (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in µF. TIMING SPECIFICATIONS T = −40°C to +125°C, acceleration = 0 g, unless otherwise noted. A Table 2. Parameter1, 2 V = 3.3 V V = 5 V Unit Description CC CC f 3 10 10 kHz min SCLK 2 2 MHz max t 14.5 × t 14.5 × t CONVERT SCLK SCLK t 1.5 × t 1.5 × t Throughput time = t + t = 16 × t ACQ SCLK SCLK CONVERT ACQ SCLK t1 10 10 ns min TCS/CS to SCLK setup time t24 60 30 ns max Delay from TCS/CS until DOUT three-state disabled t4 100 75 ns max Data access time after SCLK falling edge 3 t 20 20 ns min Data setup time prior to SCLK rising edge 4 t 20 20 ns min Data hold time after SCLK rising edge 5 t 0.4 × t 0.4 × t ns min SCLK high pulse width 6 SCLK SCLK t 0.4 × t 0.4 × t ns min SCLK low pulse width 7 SCLK SCLK t85 80 80 ns max TCS/CS rising edge to DOUT high impedance t 6 5 5 µs typ Power-up time from shutdown 9 1 Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V. 2 See Figure 3 and Figure 4. 3 Mark/space ratio for the SCLK input is 40/60 to 60/40. 4 Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or 2.4 V with VCC = 5.0 V. 5 t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Specifications is the true bus relinquish time of the part and is independent of the bus loading. 6 Shutdown recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the overall bandwidth. Rev. C | Page 4 of 16

Data Sheet ADIS16006 CIRCUIT AND TIMING DIAGRAMS 200µA IOL TO OUTPUT 1.6V PIN CL 50pF 200µA IOH 05975-002 Figure 2. Load Circuit for Digital Output Timing Specifications tACQ tCONVERT CS t1 t6 SCLK 1 2 3 4 5 6 15 16 t2 t7 t3 t8 DOUTTHREE-STATE 4 LEADING ZEROS DB11 DB10 DB9 DB0 THREE-STATE t4 DIN DCOANR’ETt5 ZERO ZERO ZERO ADD0 ONE ZERO PM0 05975-003 Figure 3. Accelerometer Serial Interface Timing Diagram TCS t1 t6 SCLK 1 2 3 4 11 15 16 THREE- t3 t7 t8 DOUT STATE LEZAEDRIONG DB9 DB8 DB0 THREE-STATE DIN 05975-004 Figure 4. Temperature Serial Interface Timing Diagram Rev. C | Page 5 of 16

ADIS16006 Data Sheet ABSOLUTE MAXIMUM RATINGS Table 3. Table 4. Package Characteristics Parameter Rating Package Type θ θ Device Weight JA JC Acceleration (Any Axis, Unpowered) 3500 g 12-Terminal LGA 200°C/W 25°C/W 0.3 grams Acceleration (Any Axis, Powered) 3500 g VCC −0.3 V to +7.0 V 3.1865 8× All Other Pins (COM − 0.3 V) to (V + 0.3 V) CC 1.797 Output Short-Circuit Duration Indefinite 8× (Any Pin to Common) 0.670 8× Operating Temperature Range −40°C to +125°C Storage Temperature Range −65°C to +150°C 6.373 3.594 2× 4× Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational 0.500 section of this specification is not implied. Exposure to absolute 1.127 12× 12× mdeavxicime ruemlia rbaitliintyg. conditions for extended periods may affect 7.2mm × 7.2mm STACKED LGA.ALL DIMENSIONS IN mm. 05975-005 Figure 5. Second-Level Assembly Pad Layout ESD CAUTION Rev. C | Page 6 of 16

Data Sheet ADIS16006 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS K LC CC S S V C 12 11 10 TCS 1 9 XFILT ADIS16006 TOP VIEW DOUT 2 (Not to Scale) 8 YFILT DIN 3 7 NC 4 5 6 M C T NC = NO COCONNECTN S 05975-006 Figure 6. Pin Configuration Table 5. Pin Function Descriptions Pin No. Mnemonic Description 1 TCS Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature sensor output. 2 DOUT Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream. The bits are clocked out on the falling edge of the SCLK input. 3 DIN Data In, Logic Input. Data to be written into the control register of the ADIS16006 is provided on this input and is clocked into the register on the rising edge of SCLK. 4 COM Common. Reference point for all circuitry on the ADIS16006. 5, 7 NC No Connect. 6 ST Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose. 8 YFILT Y-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. 9 XFILT X-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. 10 CS Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output. 11 V Power Supply Input. The V range for the ADIS16006 is 3.0 V to 5.25 V. CC CC 12 SCLK Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data to the control register. This clock input is also used as the clock source for the conversion process of the ADIS16006. Rev. C | Page 7 of 16

ADIS16006 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 25 262 AVERAGE = 2040.66 STANDARD DEVIATION = 23.19 261 B3-Y %) 20 B3-X N ( gLSB/) 225690 BBB125---YXX PULATIO 15 NSITIVITY ( 225578 BBB145---XXY ENT OF PO 10 SE B2-Y RC 256 B4-Y PE 5 255 0 254–50 –25 0 T2E5MPERA50TURE (7°5C) 100 125 150 05975-007 1995 2000 2005 2010 2015 2020 2025 2030OU2035TP2040UT2045 (LS2050B)2055 2060 2065 2070 2075 2080 2085 2090 05975-010 Figure 7. Sensitivity vs. Temperature (±1 g Stimulus) Figure 10. X-Axis 0 g Bias at 25°C 40 2048 AVERAGE = 2055.875 STANDARD DEVIATION = 6.464 35 5.25V %) 2046 AVG AT 5.25V N ( 30 O TI L (LSB) 2044 AVG AT 3.60V AVG AT 4.75V OPULA 2250 E P EV OF BIAS L 2042 AVG AT 3.30V CENT 15 R 10 AVG AT 3.00V PE 2040 5 0 2038–40 –20 0 2T0EMPE4R0ATUR6E0 (°C) 80 100 120 05975-008 1995 2000 2005 2010 2015 2020 2025 2030OU2035TP2040UT2045 (LS2050B)2055 2060 2065 2070 2075 2080 2085 2090 05975-011 Figure 8. X-Axis 0 g Bias vs. Temperature Figure 11. Y-Axis 0 g Bias at 25°C 2048 60 2047 50 2046 %) LEVEL (LSB) 222000444453 ++2152°5C°C F POPULATION ( 4300 S 2042 O BIA –40°C NT 20 2041 E C R 2040 PE 10 2039 2038 0 3.0 3.5 4.0 VCC (V) 4.5 5.0 5.5 05975-009 80 85 90 95 100N1O0I5SE1 1(µ0g/1 1H5z)120 125 130 135 140 05975-012 Figure 9. X-Axis 0 g Bias vs. Supply Voltage Figure 12. Noise (X-Axis) at VCC = 5 V, 25°C Rev. C | Page 8 of 16

Data Sheet ADIS16006 45 250 AVG AT 5.25V 40 AVG AT 5.00V %) 35 200 N ( O TI 30 B) AVG AT 4.75V PULA 25 T (LS 150 O S P E NT OF 2105 SELF T 100 AAVVGG AATT 33..3600VV E C R E 10 AVG AT 3.00V P 50 5 0 0 80 85 90 95 100N1O0I5SE1 1(µ0g/1 1H5z)120 125 130 135 140 05975-013 –50 0 TEMPERA50TURE (°C) 100 150 05975-016 Figure 13. Noise (Y-Axis) at VCC = 5 V, 25°C Figure 16. Self-Test X-Axis vs. Temperature 40 250 AVERAGE = 202.2137 STANDARD DEVIATION = 12.09035 230 35 +125°C %) 210 N ( 30 O 190 TI B) +25°C PULA 25 T (LS 170 –40°C PO 20 ES 150 T OF 15 ELF T 130 N S CE 110 R 10 E P 90 5 70 0 50 110 130 150 170OU1T9P0UT 2(L10SB)230 250 270 290 05975-014 3.0 3.5 4.0 VCC (V) 4.5 5.0 5.5 05975-017 Figure 14. X-Axis Self-Test at VCC = 5 V, 25°C Figure 17. Self-Test X-Axis vs. Supply Voltage 40 1.8 AVERAGE = 82.89281 STANDARD DEVIATION = 4.908012 +125°C 35 1.7 %) ON ( 30 A) 1.6 F POPULATI 2250 CURRENT (m 11..54 +25°C T O 15 LY 1.3 –40°C N P E P C U ER 10 S 1.2 P 5 1.1 0 40 45 50 55 60 65OU70TPU75T (L8S0B)85 90 95 100105110 05975-015 1.03.0 3.5 4.0 VCC (V) 4.5 5.0 5.5 05975-018 Figure 18. Supply Current vs. Supply Voltage Figure 15. X-Axis Self-Test at VCC = 3.3 V, 25°C Rev. C | Page 9 of 16

ADIS16006 Data Sheet 45 1.3 VCC = 5.0V VCC = 3.3V mA) 1.2 %) 35 T ( ON ( REN 1.1 ULATI 25 Y CUR 1.0 +125°C P L O P ENT OF P 15 OWN SUP 0.9 +–4205°°CC C D 0.8 PER 5 WER- O 0.7 P –5 0.6 1.15 1.19 1.23 1.27 1.31CU1.R3R5E1N.3T9 (m1A.4)3 1.47 1.51 1.55 1.59 05975-023 3.0 3.5 4.0 VCC (V)4.5 5.0 5.5 05975-020 Figure 19. Supply Current at 25°C Figure 21. Power-Down Supply Current vs. Supply Voltage 60 0.6 VCC = 5.0V 50 VCC = 3.3V 0.4 %) N ( B) 0.2 O d POPULATI 4300 G ERROR ( –0.20 ENT OF 20 AMPLIN –0.4 C S R –0.6 E P 10 –0.8 00.70 0.74 0.78 0.82 0C.8U6RR0E.N90T (m0.A94) 0.98 1.02 1.06 1.10 05975-019 –1.01 SAMPLE R1A0TE (kSPS) 100 05975-024 Figure 20. Power-Down Supply Current Figure 22. Sampling Error vs. Sampling Frequency Rev. C | Page 10 of 16

Data Sheet ADIS16006 THEORY OF OPERATION The ADIS16006 is a low cost, low power, complete dual-axis low, the next digital conversion is initiated. The details for the accelerometer with an integrated serial peripheral interface control register bit functions are shown in Table 7. (SPI) and an integrated temperature sensor whose output is Accelerometer Control Register also available on the SPI interface. The ADIS16006 is capable of MSB LSB measuring acceleration with a full-scale range of ±5 g (minimum). DONTC ZERO ZERO ZERO ADD0 ONE ZERO PM0 The ADIS16006 can measure both dynamic acceleration (vibration) and static acceleration (gravity). Table 7. Accelerometer Control Register Bit Functions ACCELEROMETER DATA FORMAT Bit Mnemonic Comments 7 DONTC Don’t care. Can be 1 or 0. The accelerometer data is in a 12-bit, offset binary format. See 6, 5, 4 ZERO These bits should be held low. Table 6 for examples of this data format. 3 ADD0 This address bit selects the x-axis or y-axis outputs. A 0 selects the x-axis; a 1 selects Table 6. Acceleration Data Format Examples the y-axis. Acceleration (g) Decimal Hex Binary 2 ONE This bit should be held high. +5 3328 0xD00 1101 0000 0000 1 ZERO This bit should be held low. +2/256 2050 0x802 1000 0000 0010 0 PM0 This bit selects the operation mode for +1/256 2049 0x801 1000 0000 0001 the accelerometer; set to 0 for normal 0 2048 0x800 1000 0000 0000 operation and 1 for power-down mode. −1/256 2047 0x7FF 0111 1111 1111 Power-Down −2/256 2046 0x7FE 0111 1111 1110 By setting PM0 to 1 when updating the accelerometer −5 768 0x300 0011 0000 0000 control register, the ADIS16006 goes into shutdown mode. SELF-TEST The information stored in the control register is maintained The ST pin controls the self-test feature. When this pin is set to during shutdown. The ADIS16006 changes modes as soon as the V , an electrostatic force is exerted on the beam of the acceler- control register is updated. If the part is in shutdown mode and CC ometer. The resulting movement of the beam allows the user to PM0 is changed to 0, the part powers up on the 16th SCLK test if the accelerometer is functional. The typical change in rising edge. output is 801 mg (corresponding to 205 LSB) for VCC = 5.0 V. ADD0 This pin can be left open-circuit or connected to common in By setting ADD0 to 0 when updating the accelerometer control normal use. The ST pin should never be exposed to voltage register, the x-axis output is selected. By setting ADD0 to 1, the greater than V + 0.3 V. If the system design is such that this CC y-axis output is selected. condition cannot be guaranteed (for example, multiple supply ZERO voltages are present), a low V clamping diode between ST and F VCC is recommended. ZERO is defined as the Logic low level. SERIAL INTERFACE ONE The serial interface on the ADIS16006 consists of five wires: CS, ONE is defined as the Logic high level. TCS, SCLK, DIN, and DOUT. Both accelerometer axes and the DONTC temperature sensor data are available on the serial interface. DONTC is defined as don’t care and can be a low or high The CS and TCS are used to select the accelerometer or tem- logic level. perature sensor outputs, respectively. CS and TCS cannot be Accelerometer Conversion Details active at the same time. Every time the accelerometer is sampled, the sampling function The SCLK input accesses data from the internal data registers. discharges the internal C or C filtering capacitors by up to 2% X Y ACCELEROMETER SERIAL INTERFACE of their initial values (assuming no additional external filtering Figure 3 shows the detailed timing diagram for serial interfacing to capacitors are added). The recovery time for the filter capacitor the accelerometer in the ADIS16006. The serial clock provides to recharge is approximately 10 µs. Therefore, sampling the the conversion clock. CS initiates the conversion process and accelerometer at a rate of 10 kSPS or less does not induce a data transfer and frames the serial data transfer for the sampling error. However, as sampling frequencies increase accelerometer output. The accelerometer output is sampled on above 10 kSPS, one can expect sampling errors to attenuate the second rising edge of the SCLK input after the falling edge the actual acceleration levels. of CS. The conversion requires 16 SCLK cycles to complete. The rising edge of CS puts the bus back into three-state. If CS remains Rev. C | Page 11 of 16

ADIS16006 Data Sheet TEMPERATURE SENSOR SERIAL INTERFACE Temperature Sensor Conversion Details Read Operation The ADIS16006 features a 10-bit digital temperature sensor that allows an accurate measurement of the ambient device temperature Figure 4 shows the timing diagram for a serial read from the to be made. temperature sensor. The TCS line enables the SCLK input. Ten bits of data and a leading zero are transferred during a read The conversion clock for the temperature sensor is internally operation. Read operations occur during streams of 16 clock generated; therefore, no external clock is required except when pulses. The serial data can be received into two bytes to reading from and writing to the serial port. In normal mode, an accommodate the entire 10-bit data stream. If only eight bits internal clock oscillator runs the automatic conversion sequence. A of resolution are required, the data can be received into a single conversion is initiated approximately every 350 µs. At this time, byte. At the end of the read operation, the DOUT line remains the temperature sensor wakes up and performs a temperature in the state of the last bit of data clocked out until TCS goes conversion. This temperature conversion typically takes 25 µs, high, at which time the DOUT line from the temperature at which time the temperature sensor automatically shuts down. sensor goes three-state. The result of the most recent temperature conversion is avail- able in the serial output register at any time. Once the conversion is Write Operation finished, an internal oscillator starts counting and is designed to Figure 4 also shows the timing diagram for the serial write time out every 350 µs. The temperature sensor then powers up to the temperature sensor. The write operation takes place at and does a conversion. the same time as the read operation. Data is clocked into the If the TCS is brought low every 350 µs (±30%) or less, the same control register on the rising edge of SCLK. DIN should remain temperature value is output onto the DOUT line every time low for the entire cycle. without changing. It is recommended that the TCS line not Temperature Sensor Control Register be brought low every 350 µs (±30%) or less. The ±30% covers MSB LSB process variation. The TCS should become active (high to low) ZERO ZERO ZERO ZERO ZERO ZERO ZERO ZERO outside this range. The device is designed to autoconvert every 350 µs. If the Table 8. Temperature Sensor Control Register Bit Functions temperature sensor is accessed during the conversion process, Bit Mnemonic Comments an internal signal is generated to prevent any update of the 7 to 0 ZERO All bits should be held low. temperature value register during the conversion. This prevents the user from reading back spurious data. The design of this ZERO feature results in this internal lockout signal being reset only at ZERO is defined as the Logic low level. the start of the next autoconversion. Therefore, if the TCS line Output Data Format goes active before the internal lockout signal is reset to its inactive mode, the internal lockout signal is not reset. To ensure that no The output data format for the temperature sensor is twos lockout signal is set, bring TCS low at a greater time than 350 µs complement. Table 9 shows the relationship between the (±30%). As a result, the temperature sensor is not interrupted temperature and the digital output. during a conversion process. Table 9. Temperature Sensor Data Format In the automatic conversion mode, every time a read or write Temperature Digital Output (DB9 … DB0) operation takes place, the internal clock oscillator is restarted at −40°C 11 0110 0000 the end of the read or write operation. The result of the conversion −25°C 11 1001 1100 is typically available 25 µs later. Reading from the device before −0.25°C 11 1111 1111 conversion is complete provides the same set of data. 0°C 00 0000 0000 POWER SUPPLY DECOUPLING +0.25°C 00 0000 0001 +10°C 00 0010 1000 The ADIS16006 integrates two decoupling capacitors that are +25°C 00 0110 0100 0.047 µF in value. For local operation of the ADIS16006, no +50°C 00 1100 1000 additional power supply decoupling capacitance is required. +75°C 01 0010 1100 However, if the system power supply presents a substantial +100°C 01 1001 0000 amount of noise, additional filtering can be required. If additional +125°C 01 1111 0100 capacitors are required, connect the ground terminal of each of these capacitors directly to the underlying ground plane. Finally, note that all analog and digital grounds should be referenced to the same system ground reference point. Rev. C | Page 12 of 16

Data Sheet ADIS16006 SETTING THE BANDWIDTH SELECTING FILTER CHARACTERISTICS: THE NOISE/BANDWIDTH TRADE-OFF The ADIS16006 has provisions for band limiting the acceler- ometer. Capacitors can be added at the XFILT pin and the The accelerometer bandwidth selected ultimately determines YFILT pin to implement further low-pass filtering for the measurement resolution (smallest detectable acceleration). antialiasing and noise reduction. The equation for the 3 dB Filtering can be used to lower the noise floor, which improves bandwidth is the resolution of the accelerometer. Resolution is dependent on the analog filter bandwidth at XFILT and YFILT. f = 1/(2π(32 kΩ) × (C + 2200 pF)) −3dB (XFILT, YFILT) The ADIS16006 has a typical bandwidth of 2.25 kHz with no or more simply, external filtering. The analog bandwidth can be further f = 5 µF/(C + 2200 pF) −3dB (XFILT, YFILT) decreased to reduce noise and improve resolution. The tolerance of the internal resistor (R ) can vary typically as FILT The ADIS16006 noise has the characteristics of white Gaussian much as ±25% of its nominal value (32 kΩ); thus, the bandwidth noise, which contributes equally at all frequencies and is described varies accordingly. in terms of µg/√Hz (that is, the noise is proportional to the A minimum capacitance of 0 pF for CXFILT and CYFILT is allowable. square root of the bandwidth of the accelerometer). The user should limit bandwidth to the lowest frequency needed by the Table 10. Filter Capacitor Selection, C and C XFILT YFILT application to maximize the resolution and dynamic range of Bandwidth (Hz) Capacitor (µF) the accelerometer. 1 4.7 With the single-pole, roll-off characteristic, the typical noise of 10 0.47 the ADIS16006 is determined by 50 0.10 100 0.047 rmsNoise = (200 µg/√Hz) × (√(BW × 1.57)) 200 0.022 At 100 Hz, the noise is 400 0.01 rmsNoise = (200 µg/√Hz) × (√(100 × 1.57)) = 2.5 mg 2250 0 Often, the peak value of the noise is desired. Peak-to-peak noise can only be estimated by statistical methods. Table 11 is useful for estimating the probabilities of exceeding various peak values, given the rms value. Table 11. Estimation of Peak-to-Peak Noise Percentage of Time Noise Exceeds Peak-to-Peak Value Nominal Peak-to-Peak Value (%) 2 × rms 32 4 × rms 4.6 6 × rms 0.27 8 × rms 0.006 Rev. C | Page 13 of 16

ADIS16006 Data Sheet 12 11 10 ay 1 9 ax DIGITAL OUTPUT (IN LSBs) 2 X-AXIS: 1792 8 Y-AXIS: 2048 3 7 4 5 6 9 8 7 3 2 1 10 6 4 ax 12 ay DIGITAL OUTPUT (IN LSBs) DIGITAL OUTPUT (IN LSBs) 11 XY--AAXXIISS:: 22034084 5 NToot pto V Siecwale 5 XY--AAXXIISS:: 21074982 11 ay 12 ax 4 6 10 1 2 3 7 8 9 6 5 4 7 3 DIGITAL OUTPUT (IN LSBs) DIGITAL OUTPUT (IN LSBs) 8 X-AXIS: 2304 2 X-AXIS: 2048 Y-AXIS: 2048 Y-AXIS: 2048 ax 9 1 ay 10 11 12 05975-021 Figure 23. Output Response vs. Orientation Rev. C | Page 14 of 16

Data Sheet ADIS16006 APPLICATIONS SECOND LEVEL ASSEMBLY The ADIS16006 can be attached to the second level assembly board using SN63 (or equivalent) or lead-free solder. IPC/ JEDEC J-STD-020 and J-STD-033 provide standard handling procedures for these types of packages. Rev. C | Page 15 of 16

ADIS16006 Data Sheet OUTLINE DIMENSIONS 3.594 BSC (4×) 1.797 PIN 1 7.35 BSC INDICATOR MAX (8×) 1.00 BSC 10 12 (12×) 9 1 6 .373 7.20 BSC TYP (2×) 7 3 0.797 BSC (8×) 6 4 TOP VIEW 0.200 BOTTOM VIEW 0.373 BSC MIN (12×) (ALL SIDES) 5.00 TYP 3.70 MAX SIDE VIEW 092407-C Figure 24. 12-Terminal Land Grid Array [LGA] (CC-12-1) Dimensions shown in millimeters ORDERING GUIDE Model1 Temperature Range Package Description Package Option ADIS16006CCCZ −40°C to +125°C 12-Terminal Land Grid Array (LGA) CC-12-1 ADIS16006/PCBZ Evaluation Board 1 Z = RoHS Compliant Part. ©2006–2013 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05975-0-2/13(C) Rev. C | Page 16 of 16

Mouser Electronics Authorized Distributor Click to View Pricing, Inventory, Delivery & Lifecycle Information: A nalog Devices Inc.: ADIS16006/PCBZ ADIS16006CCCZ